Inventor · disambiguated record
Yu Yanaka
Also filed as: YANAKA YU
3 granted patents·7 pending applications·26 citations·filing 2010–2013
61Inventor score
Technology areasG01N
Top patents by PatentIndex Score
10 records- 0190US8547545B2Method and apparatus for inspecting a surface of a substrateSASAZAWA HIDEAKI·Filed 2011·Granted Oct 1, 2013·25 cites·12 claims
- 0255US8605278B2Method and apparatus for inspecting patterned media diskSUZUKI RYUTA·Filed 2011·Granted Dec 10, 2013·1 cites·3 claims
- 0341US2014043603A1Surface inspecting apparatus having double recipe processing functionHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 0441US2014071442A1Optical surface defect inspection apparatus and optical surface defect inspection methodHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 0540US2013258328A1Disk surface inspection method and disk surface inspection deviceHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 0639US2013077092A1Substrate surface defect inspection method and inspection deviceSASAZAWA HIDEAKI·Filed 2012·Application pending·0 cites
- 0735US2012320367A1Inspection method and device for sameYANAKA YU·Filed 2011·Application pending·0 cites
- 0835US2013258320A1Method and apparatus for inspecting surface of a magnetic diskHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 0935US2010246356A1Disk surface defect inspection method and apparatusHITACHI HIGH TECH CORP·Filed 2010·Application pending·0 cites
- 1034US8873031B2Method and apparatus for inspecting surface of a diskHITACHI HIGH TECH CORP·Filed 2013·Granted Oct 28, 2014·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →