Inventor · disambiguated record
Yueyan Zhang
Also filed as: ZHANG YUEYAN
6 granted patents·5 pending applications·2 citations·filing 2012–2023
66Inventor score
Top patents by PatentIndex Score
11 records- 0167US2023089692A1Dynamic covalent polymerizations with elemental sulfur and sulfur prepolymersUNIV ARIZONA·Filed 2022·Application pending·0 cites
- 0264US2023331940A1Chalcogenide hybrid inorganic/organic polymer (chip) materials as improved crosslinking agents for vulcanizationUNIV ARIZONA·Filed 2023·Application pending·0 cites
- 0353US9470518B2Daily checking and calibrating method of length measuring machineSHENZHEN CHINA STAR OPTOELECT·Filed 2013·Granted Oct 18, 2016·2 cites·11 claims
- 0451US11674005B2Chalcogenide Hybrid Inorganic/organic Polymer (CHIP) materials as improved crosslinking agents for vulcanizationUNIV ARIZONA·Filed 2018·Granted Jun 13, 2023·0 cites·20 claims
- 0548US9888236B2Liquid crystal panel and the detection method on image sticking of the liquid crystal panelSHENZHEN CHINA STAR OPTOELECT·Filed 2013·Granted Feb 6, 2018·0 cites·8 claims
- 0647US9623430B2Slit nozzle cleaning device for coatersSHENZHEN CHINA STAR OPTOELECT·Filed 2014·Granted Apr 18, 2017·0 cites·13 claims
- 0742US9880465B2Photoresist composition and color filter manufacturing methodSHENZHEN CHINA STAR OPTOELECT·Filed 2015·Granted Jan 30, 2018·0 cites·10 claims
- 0842US2021047472A1Dynamic covalent polymerizations with elemental sulfur and sulfur prepolymersUNIV ARIZONA·Filed 2017·Application pending·0 cites
- 0938US9646224B2Image processing method, image processing device and automated optical inspection machineSHENZHEN CHINA STAR OPTOELECT·Filed 2014·Granted May 9, 2017·0 cites·11 claims
- 1033US2014160478A1Method and system for correcting measurement difference of transmittance frequency spectrum of color filterSHENZHEN CHINA STAR OPTOELECT·Filed 2012·Application pending·0 cites
- 1127US2014190532A1Nozzle cleaning device and coater provided with itZHANG YUEYAN·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →