Inventor · disambiguated record
Yves Huttel
Also filed as: HUTTEL YVES
1 granted patent·1 pending application·0 citations·filing 2011–2019
12Inventor score
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2 records- 0128US9015861B2Modification of atomic force microscopy tips by deposition of nanoparticles with an aggregate sourceROMÁN GARCÍA ELISA LEONOR·Filed 2011·Granted Apr 21, 2015·0 cites·8 claims
- 0227US2021318352A1System for scanning probe microscopy applications and method for obtaining said systemCONSEJO SUPERIOR INVESTIGACION·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →