Inventor · disambiguated record
Yves Surrel
Also filed as: SURREL YVES
1 granted patent·3 pending applications·14 citations·filing 2001–2011
36Inventor score
Top patents by PatentIndex Score
4 records- 0161US7430049B2Method and device for analyzing the surface of a substrateSAINT GOBAIN·Filed 2001·Granted Sep 30, 2008·14 cites·26 claims
- 0224US2009257052A1Device for inspecting the quality of a surfaceVISUOL TECHNOLOGIES·Filed 2009·Application pending·0 cites
- 0321US2011285987A1Installation for the quality control of a surface of an objectSURREL YVES·Filed 2011·Application pending·0 cites
- 0420US2004075839A1Novel high-precision lambdameter operating without optical moving partsFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →