Inventor · disambiguated record
Zane Drussel
Also filed as: DRUSSEL ZANE · DRUSSEL ZANE L
10 granted patents·100 citations·filing 1997–2003
90Inventor score
Files withMICRON TECHNOLOGY INC10
Top patents by PatentIndex Score
10 records- 0170US6638831B1Use of a reference fiducial on a semiconductor package to monitor and control a singulation methodMICRON TECHNOLOGY INC·Filed 2000·Granted Oct 28, 2003·15 cites·11 claims
- 0267US6239380B1Singulation methods and substrates for use with sameMICRON TECHNOLOGY INC·Filed 1999·Granted May 29, 2001·27 cites·5 claims
- 0365US6047470ASingulation methodsMICRON TECHNOLOGY INC·Filed 1997·Granted Apr 11, 2000·24 cites·16 claims
- 0455US6664480B2Singulation methods and substrates for use with sameMICRON TECHNOLOGY INC·Filed 2001·Granted Dec 16, 2003·5 cites·59 claims
- 0553US6744134B2Use of a reference fiducial on a semiconductor package to monitor and control a singulation methodMICRON TECHNOLOGY INC·Filed 2002·Granted Jun 1, 2004·5 cites·25 claims
- 0652US6544803B2Method for determining the concentration of contamination on a componentMICRON TECHNOLOGY INC·Filed 2001·Granted Apr 8, 2003·3 cites·19 claims
- 0752US5961722AApparatus for establishing reference coordinates for a point on a componentMICRON TECHNOLOGY INC·Filed 1997·Granted Oct 5, 1999·13 cites·18 claims
- 0849US6886247B2Circuit board singulation methodsMICRON TECHNOLOGY INC·Filed 2003·Granted May 3, 2005·3 cites·6 claims
- 0940US6838295B2Method for determining the location of a droplet on a componentMICRON TECHNOLOGY INC·Filed 2003·Granted Jan 4, 2005·0 cites·10 claims
- 1037US6242271B1Method for establishing reference coordinates for a point on a componentMICRON TECHNOLOGY INC·Filed 1999·Granted Jun 5, 2001·5 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →