Inventor · disambiguated record

Ze Xi Deng

Also filed as: DENG ZE XI

2 granted patents·5 citations·filing 2011–2013

47Inventor score

Technology areasG03F

Files withHUNG CHI YUAN1 SEMICONDUCTOR MFG INT SHANGHAI1

Top patents by PatentIndex Score

2 records

0181US8501376B2System and method for test pattern for lithography processHUNG CHI YUAN·Filed 2011·Granted Aug 6, 2013·5 cites·19 claims
0253US8921013B2System and method for test pattern for lithography processSEMICONDUCTOR MFG INT SHANGHAI·Filed 2013·Granted Dec 30, 2014·0 cites·20 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →