Inventor · disambiguated record
Zhijie Bao
Also filed as: BAO ZHIJIE
3 granted patents·1 pending application·0 citations·filing 2020–2023
37Inventor score
Files withMACROTEST SEMICONDUCTOR TECH CO LTD2MACROTEST SEMICONDUCTOR INC1NAN JING MACROTEST SEMICONDUCTOR TECH CO LTD1
Top patents by PatentIndex Score
4 records- 0142US2025138062A1High-end voltage differential sampling and calibration system and methodMACROTEST SEMICONDUCTOR TECH CO LTD·Filed 2023·Application pending·0 cites
- 0239US12277077B1Software-decoupling-based hardware control apparatus and methodMACROTEST SEMICONDUCTOR TECH CO LTD·Filed 2023·Granted Apr 15, 2025·0 cites·5 claims
- 0339US12130718B2SOC-oriented concurrent test system for multiple clock domains and test method thereofMACROTEST SEMICONDUCTOR INC·Filed 2022·Granted Oct 29, 2024·0 cites·9 claims
- 0423US11977111B2Pull out-assisting linkage device for test load board of automatic semiconductor test equipmentNAN JING MACROTEST SEMICONDUCTOR TECH CO LTD·Filed 2020·Granted May 7, 2024·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →