Inventor · disambiguated record

Zhiyan Huang

Also filed as: HUANG ZHIYAN

1 granted patent·2 pending applications·44 citations·filing 2007–2008

48Inventor score

Technology areasG01N

Files withACCRETECH USA INC3

Top patents by PatentIndex Score

3 records

0193US7508504B2Automatic wafer edge inspection and review systemACCRETECH USA INC·Filed 2007·Granted Mar 24, 2009·44 cites·25 claims
0247US2009122304A1Apparatus and Method for Wafer Edge Exclusion MeasurementACCRETECH USA INC·Filed 2008·Application pending·0 cites
0347US2009116727A1Apparatus and Method for Wafer Edge Defects DetectionACCRETECH USA INC·Filed 2008·Application pending·0 cites

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →