Inventor · disambiguated record
Zhi-Min Ling
Also filed as: LING ZHI · LING ZHI-MIN
21 granted patents·2 pending applications·1,036 citations·filing 1995–2021
96Inventor score
Top patents by PatentIndex Score
23 records- 0197US8343795B2Method to break and assemble solar cellsLUO YUHAO·Filed 2010·Granted Jan 1, 2013·37 cites·9 claims
- 0296US6950771B1Correlation of electrical test data with physical defect dataXILINX INC·Filed 2003·Granted Sep 27, 2005·444 cites·16 claims
- 0392US6817006B1Application-specific testing methods for programmable logic devicesXILINX INC·Filed 2002·Granted Nov 9, 2004·51 cites·25 claims
- 0491US6891395B2Application-specific testing methods for programmable logic devicesXILINX INC·Filed 2004·Granted May 10, 2005·43 cites·16 claims
- 0588US5930138AArrangement and method for detecting sequential processing effects in manufacturing using predetermined sequences within runsADVANCED MICRO DEVICES INC·Filed 1997·Granted Jul 27, 1999·85 cites·7 claims
- 0686US6594610B1Fault emulation testing of programmable logic devicesXILINX INC·Filed 2001·Granted Jul 15, 2003·36 cites·24 claims
- 0783US5598341AReal-time in-line defect disposition and yield forecasting systemADVANCED MICRO DEVICES INC·Filed 1995·Granted Jan 28, 1997·82 cites·17 claims
- 0880US6664808B2Method of using partially defective programmable logic devicesXILINX INC·Filed 2001·Granted Dec 16, 2003·26 cites·22 claims
- 0980US5761065AArrangement and method for detecting sequential processing effects in manufacturingADVANCED MICRO DEVICES INC·Filed 1995·Granted Jun 2, 1998·61 cites·28 claims
- 1075US6001663AApparatus for detecting defect sizes in polysilicon and source-drain semiconductor devices and method for making the sameADVANCED MICRO DEVICES INC·Filed 1999·Granted Dec 14, 1999·46 cites·6 claims
- 1172US7626874B1Method and apparatus for testing a memory device with a redundant self repair featureXILINX INC·Filed 2007·Granted Dec 1, 2009·9 cites·20 claims
- 1272US7227364B1Test circuit for and method of identifying a defect in an integrated circuitXILINX INC·Filed 2004·Granted Jun 5, 2007·15 cites·20 claims
- 1370US7020860B1Method for monitoring and improving integrated circuit fabrication using FPGAsXILINX INC·Filed 2004·Granted Mar 28, 2006·15 cites·21 claims
- 1469US6376131B1Methods and structures for protecting reticles from ESD failureXILINX INC·Filed 2000·Granted Apr 23, 2002·10 cites·5 claims
- 1564US7246285B1Method of automatic fault isolation in a programmable logic deviceXILINX INC·Filed 2004·Granted Jul 17, 2007·12 cites·23 claims
- 1661US5821765AApparatus for detecting defect sizes in polysilicon and source-drain semiconductor devices and method for making the sameADVANCED MICRO DEVICES INC·Filed 1997·Granted Oct 13, 1998·20 cites·8 claims
- 1756US7145344B2Method and circuits for localizing defective interconnect resources in programmable logic devicesXILINX INC·Filed 2003·Granted Dec 5, 2006·6 cites·12 claims
- 1856US5670891AStructures to extract defect size information of poly and source-drain semiconductor devices and method for making the sameADVANCED MICRO DEVICES INC·Filed 1995·Granted Sep 23, 1997·16 cites·18 claims
- 1954US5716856AArrangement and method for detecting sequential processing effects in manufacturing using predetermined sequences within runsADVANCED MICRO DEVICES INC·Filed 1995·Granted Feb 10, 1998·17 cites·9 claims
- 2054US2011088743A1Method to manage a photovoltaic systemLUO YUHAO·Filed 2010·Application pending·0 cites
- 2147US2011017263A1Method and device for fabricating a solar cell using an interface pattern for a packaged designSOLARIA CORP·Filed 2008·Application pending·0 cites
- 2246US12398199B2Nano antibody for neutralizing toxicity of SARS-CoV-2 and preparation method and application thereofSYSVAX INC·Filed 2021·Granted Aug 26, 2025·0 cites·7 claims
- 2338US5963780AMethod for detecting defect sizes in polysilicon and source-drain semiconductor devicesADVANCED MICRO DEVICES INC·Filed 1997·Granted Oct 5, 1999·5 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →