Inventor · disambiguated record
Zhaowu Liu
Also filed as: LIU ZHAOWU
7 granted patents·1 pending application·2 citations·filing 2022–2025
69Inventor score
Files withCHANGCHUN INST OPTICS FINE MECH & PHYSICS CAS7CHANGCHUN INSTITUTE OF OPTICS FINE MECH AND PHYSICS ACADEMY OF SCIENCES1
Top patents by PatentIndex Score
8 records- 0192US12392602B1Littrow grating interferometry device and use thereofCHANGCHUN INST OPTICS FINE MECH & PHYSICS CAS·Filed 2025·Granted Aug 19, 2025·1 cites·7 claims
- 0285US12241739B1Bidirectional Littrow two-degree-of-freedom grating interference measurement device based on double gratingsCHANGCHUN INST OPTICS FINE MECH & PHYSICS CAS·Filed 2024·Granted Mar 4, 2025·1 cites·4 claims
- 0360US12188794B1Grating displacement measurement device and method using double-layer floating reading head, medium, and apparatusCHANGCHUN INST OPTICS FINE MECH & PHYSICS CAS·Filed 2024·Granted Jan 7, 2025·0 cites·8 claims
- 0459US12405570B2Method and device for compensating surface error of holographic grating substrateCHANGCHUN INST OPTICS FINE MECH & PHYSICS CAS·Filed 2024·Granted Sep 2, 2025·0 cites·3 claims
- 0554US12392599B1Hybrid displacement measuring deviceCHANGCHUN INST OPTICS FINE MECH & PHYSICS CAS·Filed 2025·Granted Aug 19, 2025·0 cites·9 claims
- 0652US11860057B2Heterodyne one-dimensional grating measuring device and measuring method thereofCHANGCHUN INST OPTICS FINE MECH & PHYSICS CAS·Filed 2022·Granted Jan 2, 2024·0 cites·20 claims
- 0746US2022146249A1Grating displacement measuring device and method based on conical diffractionCHANGCHUN INST OPTICS FINE MECH & PHYSICS CAS·Filed 2022·Application pending·0 cites
- 0842US12188793B2Heterodyne two-dimensional grating measuring device and measuring method thereofCHANGCHUN INSTITUTE OF OPTICS FINE MECH AND PHYSICS ACADEMY OF SCIENCES·Filed 2022·Granted Jan 7, 2025·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →