Inventor · disambiguated record
Zhijian Pei
Also filed as: PEI ZHIJIAN
2 granted patents·1 pending application·44 citations·filing 1999–2018
64Inventor score
Top patents by PatentIndex Score
3 records- 0167US6600557B1Method for the detection of processing-induced defects in a silicon waferMEMC ELECTRONIC MATERIALS·Filed 2000·Granted Jul 29, 2003·16 cites·24 claims
- 0260US6114245AMethod of processing semiconductor wafersMEMC ELECTRONIC MATERIALS·Filed 1999·Granted Sep 5, 2000·28 cites·17 claims
- 0341US2019111585A1Hierarchical compositions for the additive manufacturing of materialsTEXAS A & M UNIV SYS·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →