Inventor · disambiguated record
Zhengkun Peng
Also filed as: PENG ZHENGKUN
2 granted patents·6 citations·filing 2005–2019
50Inventor score
Technology areasG01N
Top patents by PatentIndex Score
2 records- 0174US11846595B2Diffraction device and method for non-destructive testing of internal crystal orientation uniformity of workpieceTHE 59TH INST OF CHINA ORDNANCE INDUSTRY·Filed 2019·Granted Dec 19, 2023·2 cites·18 claims
- 0262US7583788B2Measuring device for the shortwavelength x ray diffraction and a method thereofSOUTH WEST TECHNOLOGY & ENGINE·Filed 2005·Granted Sep 1, 2009·4 cites·44 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →