Inventor · disambiguated record
Zhanfeng Qin
Also filed as: QIN ZHANFENG
12 granted patents·44 citations·filing 2013–2020
87Inventor score
Top patents by PatentIndex Score
12 records- 0196US10014148B2Electron source, X-ray source and device using the X-ray sourceNUCTECH CO LTD·Filed 2015·Granted Jul 3, 2018·21 cites·20 claims
- 0288US10274636B2X-ray fluoroscopic imaging systemNUCTECH CO LTD·Filed 2014·Granted Apr 30, 2019·8 cites·23 claims
- 0381US11830698B2Constant current-controlled power supply circuit and field emission electron sourceNURAY TECH CO LTD·Filed 2020·Granted Nov 28, 2023·2 cites·20 claims
- 0480US10129971B2Standing wave electron linear accelerator and container/vehicle inspection systemNUCTECH CO LTD·Filed 2013·Granted Nov 13, 2018·5 cites·20 claims
- 0576US12149170B2Power supply circuit and field emission electron sourceNURAY TECH CO LTD·Filed 2020·Granted Nov 19, 2024·2 cites·16 claims
- 0673US9857317B2X-ray fluoroscopic imaging systemNUCTECH CO LTD·Filed 2014·Granted Jan 2, 2018·3 cites·18 claims
- 0772US11792908B2Time-division multiplexing control device and systemNURAY TECH CO LTD·Filed 2020·Granted Oct 17, 2023·1 cites·20 claims
- 0869US11026319B2Multi-output high-voltage power supply and distributed ray source with multi-output high-voltage power supplyUNIV TSINGHUA·Filed 2019·Granted Jun 1, 2021·1 cites·11 claims
- 0968US9341736B2Goods inspection apparatus using distributed X-ray sourceNUCTECH CO LTD·Filed 2013·Granted May 17, 2016·1 cites·8 claims
- 1042US10648929B2Trailed multiple-viewing-angle item inspection system and method of using the sameNUCTECH CO LTD·Filed 2015·Granted May 12, 2020·0 cites·18 claims
- 1140US10969346B2X-ray product quality automatic inspection deviceNUCTECH CO LTD·Filed 2015·Granted Apr 6, 2021·0 cites·12 claims
- 1238US10078056B2X-ray product quality online inspection deviceNUCTECH CO LTD·Filed 2015·Granted Sep 18, 2018·0 cites·20 claims
Join the waitlist — get patent alerts
Get an alert when Zhanfeng Qin files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →