Inventor · disambiguated record
Zhong-Kui Yuan
Also filed as: YUAN ZHONG-KUI
46 granted patents·17 pending applications·73 citations·filing 2006–2014
96Inventor score
Files withCHANG CHIH-KUANG31HONGFUJIN PREC IND SHENZHEN22HON HAI PREC IND CO LTD6HONG FU JIN PREC IND (SHENZHEN) CO LTD2FU TAI HUA IND SHENZHEN CO LTD1
Top patents by PatentIndex Score
63 records- 0183USD719039SImage measuring deviceHON HAI PREC IND CO LTD·Filed 2013·Granted Dec 9, 2014·28 cites·1 claims
- 0277US9207076B2Computing device and method for determining ricochet vectors of a probe of a coordinate measuring machineHONGFUJIN PREC IND SHENZHEN·Filed 2012·Granted Dec 8, 2015·5 cites·15 claims
- 0375US8326062B2System and method for binarizing a gray-scale image in an electronic deviceCHANG CHIH-KUANG·Filed 2009·Granted Dec 4, 2012·4 cites·15 claims
- 0475US7885528B2System and method for focusing a charge coupled device lens on a selected surface of an objectHONGFUJIN PREC IND SHENZHEN·Filed 2009·Granted Feb 8, 2011·4 cites·20 claims
- 0567US8090144B2System and method for adjusting luminance of a light-emitting device on an image measuring machineCHANG CHIH-KUANG·Filed 2008·Granted Jan 3, 2012·2 cites·17 claims
- 0666US9541234B2Measuring machine having a protective coverHONG FU JIN PREC IND (SHENZHEN) CO LTD·Filed 2014·Granted Jan 10, 2017·1 cites·15 claims
- 0766US8304705B2System and method for adjusting light sources in measurement of a surface imageCHANG CHIH-KUANG·Filed 2009·Granted Nov 6, 2012·2 cites·17 claims
- 0866US8045791B2System and method for measuring digital images of a workpieceHONGFUJIN PREC IND SHENZHEN·Filed 2007·Granted Oct 25, 2011·4 cites·7 claims
- 0964US8913252B2Computing device and measurement control methodHONGFUJIN PREC IND SHENZHEN·Filed 2013·Granted Dec 16, 2014·2 cites·19 claims
- 1062US8756420B2System and method for encrypting and storing dataCHANG CHIH-KUANG·Filed 2012·Granted Jun 17, 2014·1 cites·9 claims
- 1161US8203604B2Calibration plate and calibration methodCHANG CHIH-KUANG·Filed 2008·Granted Jun 19, 2012·1 cites·7 claims
- 1259US8121416B2System and method for determining inflection points in an image of an objectCHANG CHIH-KUANG·Filed 2009·Granted Feb 21, 2012·2 cites·19 claims
- 1358US9239230B2Computing device and method for measuring widths of measured partsHONGFUJIN PREC IND SHENZHEN·Filed 2012·Granted Jan 19, 2016·1 cites·15 claims
- 1457US8913125B2Electronic device and method for regulating coordinates of probe measurement systemCHANG CHIH-KUANG·Filed 2012·Granted Dec 16, 2014·1 cites·20 claims
- 1554US8249354B2System and method for finding edge points of an objectCHANG CHIH-KUANG·Filed 2008·Granted Aug 21, 2012·2 cites·8 claims
- 1654US8094191B2System and method for correcting an imageCHANG CHIH-KUANG·Filed 2009·Granted Jan 10, 2012·1 cites·20 claims
- 1753US7936948B2System and method for merging differently focused imagesHONGFUJIN PREC IND SHENZHEN·Filed 2007·Granted May 3, 2011·1 cites·13 claims
- 1853US7433797B2Method for verifying scan precision of a laser measurement machineHONGFUJIN PREC IND SHENZHEN·Filed 2006·Granted Oct 7, 2008·2 cites·4 claims
- 1951US7688355B2System and method for storing images of a workpieceHONGFUJIN PREC IND SHENZHEN·Filed 2007·Granted Mar 30, 2010·0 cites·7 claims
- 2050US8605270B2Computing device and precision testing method of optical lens using the computing deviceCHANG CHIH-KUANG·Filed 2012·Granted Dec 10, 2013·0 cites·15 claims
- 2150US7453369B2System and method for voice alarm in measuring a workpieceHONGFUJIN PREC IND SHENZHEN·Filed 2006·Granted Nov 18, 2008·0 cites·15 claims
- 2249US8437981B2System and method for verifying manufacturing accuracyCHANG CHIH-KUANG·Filed 2010·Granted May 7, 2013·0 cites·11 claims
- 2349US2015116486A1Terminal device, image measuring system and method of inspection of workpieceFU TAI HUA IND SHENZHEN CO LTD·Filed 2014·Application pending·0 cites
- 2449US2010042921A1System and method for viewing software help documentationHONGFUJIN PREC IND SHENZHEN·Filed 2009·Application pending·0 cites
- 2548US8908084B2Electronic device and method for focusing and measuring points of objectsCHANG CHIH-KUANG·Filed 2012·Granted Dec 9, 2014·0 cites·12 claims
- 2646USD737152SImage measuring deviceHON HAI PREC IND CO LTD·Filed 2014·Granted Aug 25, 2015·5 cites·1 claims
- 2746US9075302B2Computing device, storage medium, and method for calibrating light channels of light source deviceCHANG CHIH-KUANG·Filed 2012·Granted Jul 7, 2015·0 cites·15 claims
- 2844US9549114B2Focus identification method, system, and computing deviceHONG FU JIN PREC IND (SHENZHEN) CO LTD·Filed 2014·Granted Jan 17, 2017·0 cites·15 claims
- 2944US9064183B2Computing device and method for identifying border lines of elements on images of objectsCHANG CHIH-KUANG·Filed 2012·Granted Jun 23, 2015·0 cites·12 claims
- 3044US8805674B2Electronic device and method for supporting multiple languages in image measurement programsCHANG CHIH-KUANG·Filed 2012·Granted Aug 12, 2014·0 cites·9 claims
- 3144US8300976B2System and method for adjusting backlight in measurement of a profile imageCHANG CHIH-KUANG·Filed 2008·Granted Oct 30, 2012·0 cites·19 claims
- 3244US8217999B2Light source for vision measuring instrument and positioning system using the sameCHANG CHIH-KUANG·Filed 2009·Granted Jul 10, 2012·0 cites·5 claims
- 3343US9430609B2Electronic device and method for analyzing adjoining parts of a productCHANG CHIH-KUANG·Filed 2011·Granted Aug 30, 2016·0 cites·12 claims
- 3443US9110448B2System and method for processing a point cloud using a computing deviceCHANG CHIH-KUANG·Filed 2012·Granted Aug 18, 2015·0 cites·18 claims
- 3543US9091821B2Device and method of focusing on points of objectsCHANG CHIH-KUANG·Filed 2011·Granted Jul 28, 2015·0 cites·18 claims
- 3643US9038434B2Computing device and method for calibrating star probe of image measuring machineCHANG CHIH-KUANG·Filed 2012·Granted May 26, 2015·0 cites·18 claims
- 3743US7852354B2System and method for merging images of an objectHONGFUJIN PREC IND SHENZHEN·Filed 2007·Granted Dec 14, 2010·0 cites·7 claims
- 3843US7256896B2Method for verifying scan precision of a laser measurement machineHON HAI PREC IND CO LTD·Filed 2006·Granted Aug 14, 2007·2 cites·6 claims
- 3943US2010169041A1System and method for displaying illustrative information of measured dataHONGFUJIN PREC IND SHENZHEN·Filed 2009·Application pending·0 cites
- 4043US2013174119A1Computing device and method for automatically generating measuring programsHONGFUJIN PREC IND SHENZHEN·Filed 2012·Application pending·0 cites
- 4142US8885946B2Computing device and method of determining border points for measuring images of objectsHONGFUJIN PREC IND SHENZHEN·Filed 2013·Granted Nov 11, 2014·0 cites·15 claims
- 4242US8867044B2Computing device and method for scanning edges of an objectCHANG CHIH-KUANG·Filed 2012·Granted Oct 21, 2014·0 cites·15 claims
- 4342US8630826B2Electronic device and method for controlling probe measurementsCHANG CHIH-KUANG·Filed 2011·Granted Jan 14, 2014·0 cites·16 claims
- 4442US7968858B2System and method for scanning and measuring points of an objectHONGFUJIN PREC IND SHENZHEN·Filed 2007·Granted Jun 28, 2011·0 cites·8 claims
- 4542US7930125B2System and method for positioning a coordinate system in relation to a workpiece on a measurement machineHONGFUJIN PREC IND SHENZHEN·Filed 2008·Granted Apr 19, 2011·0 cites·14 claims
- 4642US7792655B2System and method for scanning and obtaining points of an objectHONGFUJIN PREC IND SHENZHEN·Filed 2008·Granted Sep 7, 2010·0 cites·6 claims
- 4742US2014257733A1Coordinate measurement device and method for checking installation position of each probe of star proberHON HAI PREC IND CO LTD·Filed 2013·Application pending·0 cites
- 4842US2013096709A1Computing device and method for generating engineering tolerances of a manufactured objectCHANG CHIH-KUANG·Filed 2012·Application pending·0 cites
- 4942US2007147819A1System and method for indicating sharpness of imagesHON HAI PREC IND CO LTD·Filed 2006·Application pending·0 cites
- 5041US9251579B2System and method for measuring images of objectCHANG CHIH-KUANG·Filed 2012·Granted Feb 2, 2016·0 cites·12 claims
Showing the top 50 of 63 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →