Inventor · disambiguated record
Zijie Hua
Also filed as: Hua Zijie
7 granted patents·1 pending application·3 citations·filing 2024–2024
70Inventor score
Files withHARBIN INST TECHNOLOGY8
Top patents by PatentIndex Score
8 records- 0192US12196686B1Vortex dichroism dark-field confocal microscopy measurement apparatus based on spiral transformationHARBIN INST TECHNOLOGY·Filed 2024·Granted Jan 14, 2025·2 cites·10 claims
- 0289US12276615B1Dark-field confocal microscopy measurement apparatus and method based on multi-fractional angular momentum demodulationHARBIN INST TECHNOLOGY·Filed 2024·Granted Apr 15, 2025·1 cites·8 claims
- 0368US12204081B1Dark-field confocal microscopy measurement apparatus and method based on time-varying fractional-order vortex demodulationHARBIN INST TECHNOLOGY·Filed 2024·Granted Jan 21, 2025·0 cites·10 claims
- 0468US12203867B1Dark-field confocal microscopy measurement apparatus and method based on differential fractional vortex beamHARBIN INST TECHNOLOGY·Filed 2024·Granted Jan 21, 2025·0 cites·20 claims
- 0566US12216264B2Dark-field confocal microscopic measurement apparatus and method based on vortex dichroismHARBIN INST TECHNOLOGY·Filed 2024·Granted Feb 4, 2025·0 cites·8 claims
- 0660US12313563B1Dark-field confocal microscopy measurement apparatus based on vortex interferenceHARBIN INST TECHNOLOGY·Filed 2024·Granted May 27, 2025·0 cites·8 claims
- 0759US2025138295A1Dark-field confocal microscopic measurement apparatus and method based on frequency mismatch demodulationHARBIN INST TECHNOLOGY·Filed 2024·Application pending·0 cites
- 0854US12111453B1Differential dark-field confocal microscopic measurement apparatus and method based on polarized vector light beamHARBIN INST TECHNOLOGY·Filed 2024·Granted Oct 8, 2024·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →