Inventor · disambiguated record
Zongtao Ge
Also filed as: GE ZONGTAO
16 granted patents·7 pending applications·106 citations·filing 2000–2011
92Inventor score
Top patents by PatentIndex Score
23 records- 0177US7792366B1Method of measuring amount of eccentricityFUJINON CORP·Filed 2010·Granted Sep 7, 2010·5 cites·2 claims
- 0274US6532073B2Fringe analysis error detection method and fringe analysis error correction methodFUJI PHOTO OPTICAL CO LTD·Filed 2001·Granted Mar 11, 2003·19 cites·11 claims
- 0372US6621579B2Fringe analysis method and apparatus using Fourier transformFUJI PHOTO OPTICAL CO LTD·Filed 2001·Granted Sep 16, 2003·16 cites·10 claims
- 0470US6778281B2Phase shift fringe analysis method and apparatus using the sameFUJI PHOTO OPTICAL CO LTD·Filed 2002·Granted Aug 17, 2004·14 cites·10 claims
- 0564US7880897B2Light wave interferometer apparatusFUJINON CORP·Filed 2008·Granted Feb 1, 2011·4 cites·5 claims
- 0664US6947149B2Method of assisting sample inclination error adjustmentFUJINON CORP·Filed 2003·Granted Sep 20, 2005·11 cites·6 claims
- 0763US6707559B2Method of detecting posture of object and apparatus using the sameFUJI PHOTO OPTICAL CO LTD·Filed 2001·Granted Mar 16, 2004·11 cites·27 claims
- 0857US7538890B2Wavefront-measuring interferometer apparatus, and light beam measurement apparatus and method thereofFUJINON CORP·Filed 2005·Granted May 26, 2009·2 cites·13 claims
- 0955US7719691B2Wavefront measuring apparatus for optical pickupFUJINON CORP·Filed 2008·Granted May 18, 2010·2 cites·3 claims
- 1053US6768554B2Fringe analysis method using fourier transformFUJI PHOTO OPTICAL CO LTD·Filed 2001·Granted Jul 27, 2004·6 cites·10 claims
- 1153US6693715B2Fringe analysis method using fourier transformFUJI PHOTO OPTICAL CO LTD·Filed 2000·Granted Feb 17, 2004·6 cites·11 claims
- 1251US6950191B2Method of extracting circular region from fringe imageFUJINON CORP·Filed 2003·Granted Sep 27, 2005·4 cites·7 claims
- 1346US7245384B2Sample inclination measuring methodFUJINON CORP·Filed 2003·Granted Jul 17, 2007·3 cites·10 claims
- 1445US7119907B2Low coherent interference fringe analysis methodFUJINON CORP·Filed 2003·Granted Oct 10, 2006·3 cites·5 claims
- 1544US2009309957A1Omnidirectional imaging apparatusGE ZONGTAO·Filed 2009·Application pending·0 cites
- 1643US7982882B2Optical wave interference measuring apparatusFUJINON CORP·Filed 2009·Granted Jul 19, 2011·0 cites·6 claims
- 1736US8059278B2Optical wave interference measuring apparatusGE ZONGTAO·Filed 2009·Granted Nov 15, 2011·0 cites·5 claims
- 1835US2010201992A1Lightwave interference measurement deviceGE ZONGTAO·Filed 2009·Application pending·0 cites
- 1931US2010246900A1Method and apparatus of measuring positional variation of rotation center lineGE ZONGTAO·Filed 2010·Application pending·0 cites
- 2030US2010309458A1Asphere measurement method and apparatusGE ZONGTAO·Filed 2010·Application pending·0 cites
- 2129US2011242545A1Aspheric surface measuring apparatusFUJIFILM CORP·Filed 2011·Application pending·0 cites
- 2228US2011304856A1Lightwave interference measurement apparatusGE ZONGTAO·Filed 2011·Application pending·0 cites
- 2325US2010231923A1Three-dimensional shape measuring method and deviceGE ZONGTAO·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →