Inventor · disambiguated record

Zunfeng Wang

Also filed as: WANG ZUNFENG

1 granted patent·0 citations·filing 2016–2016

1Inventor score

Technology areasG01R

Files with41ST INST CHINA ELECTRONICS TECH GROUP CORP1

Top patents by PatentIndex Score

1 record

0116US10168369B2Device and method of testing dual-frequency nonlinear vector network parameters41ST INST CHINA ELECTRONICS TECH GROUP CORP·Filed 2016·Granted Jan 1, 2019·0 cites·1 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →