Inventor · name-matched record
AHN JINWOO
2 granted patents·1 pending application·0 citations·filing 2023–2025
23Inventor score
This identity is grouped by exact name match (no disambiguated inventor record was available for these filings) — it may combine same-named inventors.
Top patents by PatentIndex Score
3 records- 0169US2026043749A1Method and apparatus for inspecting display panelSAMSUNG DISPLAY CO LTD·Filed 2025·Application pending·0 cites
- 0264US12578178B2Pupil image measuring device and methodSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Mar 17, 2026·0 cites·18 claims
- 0359US12560529B2Imaging ellipsometer and method of measuring an overlay error using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Feb 24, 2026·0 cites·20 claims
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Identity basis: exact name match across USPTO filings. How scoring works →