Inventor · name-matched record
CHANG LI-TE
3 granted patents·6 pending applications·0 citations·filing 2023–2025
44Inventor score
This identity is grouped by exact name match (no disambiguated inventor record was available for these filings) — it may combine same-named inventors.
Top patents by PatentIndex Score
9 records- 0185US2026079828A1Model based error avoidanceMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 0284US2026011393A1Dynamic read calibrationMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 0382US2026100234A1Adaptive integrity scan in a memory sub-systemMICRON TECH INC·Filed 2025·Application pending·0 cites
- 0479US12517659B2Adaptive scanning of memory devices with supervised learningMICRON TECHNOLOGY INC·Filed 2024·Granted Jan 6, 2026·0 cites·20 claims
- 0569US2026093302A1Intrinsic temperature measurement for cross temperature handling in memory devicesMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 0668US2026039314A1Failure mode-adaptive low-density parity check soft decodingMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 0766US12572418B2Machine-learning-based system health monitoring of a memory deviceMICRON TECHNOLOGY INC·Filed 2024·Granted Mar 10, 2026·0 cites·20 claims
- 0865US12517816B2Model based error avoidanceMICRON TECHNOLOGY INC·Filed 2023·Granted Jan 6, 2026·0 cites·20 claims
- 0963US2026024590A1Cross temperature read voltage calibration for a memory systemMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
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Identity basis: exact name match across USPTO filings. How scoring works →