Inventor · name-matched record
CHUANG YING-CHENG
5 granted patents·9 pending applications·0 citations·filing 2022–2025
61Inventor score
This identity is grouped by exact name match (no disambiguated inventor record was available for these filings) — it may combine same-named inventors.
Top patents by PatentIndex Score
14 records- 0194US2026068148A1Semiconductor structure and method of manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2025·Application pending·0 cites
- 0291US2026068613A1Method of manufacturing semiconductor structure using multi-layer hard maskNANYA TECHNOLOGY CORP·Filed 2025·Application pending·0 cites
- 0390US2026040590A1Semiconductor device with programmable insulating layer and method for fabricating the sameNANYA TECHNOLOGY CORP·Filed 2025·Application pending·0 cites
- 0485US2026068285A1Semiconductor device with recessed gate and method for fabricating the sameNANYA TECHNOLOGY CORP·Filed 2025·Application pending·0 cites
- 0582US12581670B2Semiconductor device with programmable insulating layer and method for fabricating the sameNANYA TECHNOLOGY CORP·Filed 2023·Granted Mar 17, 2026·0 cites·8 claims
- 0680US12568613B2Method of manufacturing semiconductor deviceNANYA TECHNOLOGY CORP·Filed 2023·Granted Mar 3, 2026·0 cites·6 claims
- 0778US12538787B2Method of manufacturing semiconductor structure including nitrogen treatmentNANYA TECHNOLOGY CORP·Filed 2023·Granted Jan 27, 2026·0 cites·15 claims
- 0873US12543302B2Memory device having planarized fins and method of manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2023·Granted Feb 3, 2026·0 cites·18 claims
- 0968US2026089923A1Memory device and manufacturing method thereofNANYA TECHNOLOGY CORP·Filed 2024·Application pending·0 cites
- 1067US2026075915A1Method of forming semiconductor deviceNANYA TECHNOLOGY CORP·Filed 2024·Application pending·0 cites
- 1166US2026013099A1Semiconductor device and manufacturing method thereofNANYA TECHNOLOGY CORP·Filed 2024·Application pending·0 cites
- 1264US12525475B2Method of manufacturing semiconductor device using underlayer for reducing defect in array regionNANYA TECHNOLOGY CORP·Filed 2022·Granted Jan 13, 2026·0 cites·19 claims
- 1362US2026005016A1Manufacturing method of semiconductor structureNANYA TECHNOLOGY CORP·Filed 2024·Application pending·0 cites
- 1460US2026101494A1Manufacturing method of memory deviceNANYA TECH CORPORATION·Filed 2024·Application pending·0 cites
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Identity basis: exact name match across USPTO filings. How scoring works →