Inventor · name-matched record

EHBERGER DOMINIK PATRICK

0 granted patents·1 pending application·0 citations·filing 2024–2024

Technology areasH01J

Files withICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH1

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0161US2026081098A1Charged particle beam device and method for correcting astigmatism and numerical apertureICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2024·Application pending·0 cites

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Identity basis: exact name match across USPTO filings. How scoring works →