Inventor · name-matched record
IM JINOH
0 granted patents·3 pending applications·0 citations·filing 2024–2025
Files withSAMSUNG ELECTRONICS CO LTD3
This identity is grouped by exact name match (no disambiguated inventor record was available for these filings) — it may combine same-named inventors.
Top patents by PatentIndex Score
3 records- 0161US2026011609A1Method for measuring thickness of a substrateSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0253US2026036371A1Substrate processing deviceSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0351US2026047381A1Substrate processing apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
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Identity basis: exact name match across USPTO filings. How scoring works →