Inventor · name-matched record
JOO WONDON
2 granted patents·0 citations·filing 2023–2023
25Inventor score
Files withSAMSUNG ELECTRONICS CO LTD2
This identity is grouped by exact name match (no disambiguated inventor record was available for these filings) — it may combine same-named inventors.
Top patents by PatentIndex Score
2 records- 0177US12538758B2Substrate inspection system and method of manufacturing semiconductor device using substrate inspection systemSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Jan 27, 2026·0 cites·20 claims
- 0250US12557587B2Apparatus and method monitoring semiconductor manufacturing equipmentSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Feb 17, 2026·0 cites·18 claims
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Identity basis: exact name match across USPTO filings. How scoring works →