Inventor · name-matched record
Lang Murong
6 granted patents·23 pending applications·0 citations·filing 2022–2025
65Inventor score
This identity is grouped by exact name match (no disambiguated inventor record was available for these filings) — it may combine same-named inventors.
Top patents by PatentIndex Score
29 records- 0186US2026088114A1Select gate maintenance with adaptive scan frequency in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 0285US2026079828A1Model based error avoidanceMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 0384US2026064281A1Optimizing data reliability using erase retentionMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 0484US2026011393A1Dynamic read calibrationMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 0582US2026100234A1Adaptive integrity scan in a memory sub-systemMICRON TECH INC·Filed 2025·Application pending·0 cites
- 0679US12517659B2Adaptive scanning of memory devices with supervised learningMICRON TECHNOLOGY INC·Filed 2024·Granted Jan 6, 2026·0 cites·20 claims
- 0778US12554403B2Adaptive time sense parameters and overdrive voltage parameters for respective groups of wordlines in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2024·Granted Feb 17, 2026·0 cites·20 claims
- 0878US12554435B2Adaptive time sense parameters and overdrive voltage parameters for wordlines at corner temperatures in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2024·Granted Feb 17, 2026·0 cites·20 claims
- 0969US2026093302A1Intrinsic temperature measurement for cross temperature handling in memory devicesMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 1068US2026039314A1Failure mode-adaptive low-density parity check soft decodingMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 1167US2026024591A1Floating gate-based partial block handling in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 1267US2026031154A1Partial block read level design for a memory systemMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 1366US12572418B2Machine-learning-based system health monitoring of a memory deviceMICRON TECHNOLOGY INC·Filed 2024·Granted Mar 10, 2026·0 cites·20 claims
- 1465US12517816B2Model based error avoidanceMICRON TECHNOLOGY INC·Filed 2023·Granted Jan 6, 2026·0 cites·20 claims
- 1563US2026024590A1Cross temperature read voltage calibration for a memory systemMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 1658US2026037137A1High reliability media management operationsMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 1758US2026037126A1Memory sub-system for adjusting memory device programming parametersMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 1857US12572298B2Adaptive scans of memory devices of a memory sub-systemMICRON TECHNOLOGY INC·Filed 2022·Granted Mar 10, 2026·0 cites·20 claims
- 1957US2026029926A1Migrating data based on wordline information in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 2055US2026037142A1Partial blocks word line read offsetsPAPAGIANNI CHRISTINA·Filed 2024·Application pending·0 cites
- 2154US2026038608A1Adaptive read disturb scan for asymmetric blocksMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 2252US2026038607A1Temperature-based read disturb operationsMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 2352US2026031151A1Wordline group dependent corrective program verify operation in a memory deviceMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 2452US2026066020A1Selective media scanning for a virtual blockMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 2552US2026031164A1Corrective program convergence associated with memory cells of a memory sub-systemMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 2652US2026031163A1All levels program operation integrated with corrective program verify operation in a memory deviceMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 2751US2026031161A1Efficient empty page scan operationsMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 2851US2026037145A1Determining voltage offset for a memory operation using memory bin and memory positionMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 2950US2026024594A1Dynamic read disturb handling using selective scanningMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
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Identity basis: exact name match across USPTO filings. How scoring works →