Inventor · name-matched record
LEE JINWOO
5 granted patents·10 pending applications·0 citations·filing 2021–2025
58Inventor score
Files withSAMSUNG ELECTRONICS CO LTD6ATIEVA INC2SAMSUNG DISPLAY CO LTD2ELECTRONICS & TELECOMMUNICATIONS RES INST1G2GBIO INC1
This identity is grouped by exact name match (no disambiguated inventor record was available for these filings) — it may combine same-named inventors.
Top patents by PatentIndex Score
15 records- 0174US12567605B2Electrolyte including coordination compound catalyst formed of transition metal cation and aromatic-containing ligand and lithium battery including the sameELECTRONICS & TELECOMMUNICATIONS RES INST·Filed 2022·Granted Mar 3, 2026·0 cites·19 claims
- 0269US12522240B2Controlling vehicle using static objects and vehicle curvatureATIEVA INC·Filed 2023·Granted Jan 13, 2026·0 cites·25 claims
- 0369US12515696B2Controlling vehicle using static objects and heading angleATIEVA INC·Filed 2023·Granted Jan 6, 2026·0 cites·23 claims
- 0467US2026024204A1Automated method for classifying prosthesis type from three dimensional oral data and computer readable medium having program for performing the methodIMAGOWORKS INC·Filed 2025·Application pending·0 cites
- 0567US2026073865A1Display device and electronic device including the sameSAMSUNG DISPLAY CO LTD·Filed 2025·Application pending·0 cites
- 0664US2026082545A1Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0761US2026072080A1Pulse electron microscope device and inspection method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0859US2026000612A1Sustained-release microparticles containing drug and pamoic acidG2GBIO INC·Filed 2023·Application pending·0 cites
- 0958US12580018B2Additional silicide layer on top of staircase for 3D NAND WL contact connectionIntel NDTM US LLC·Filed 2021·Granted Mar 17, 2026·0 cites·18 claims
- 1058US2026071980A1Method of inspecting a semiconductor device and method of manufacturing a semiconductor device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 1156US2026058091A1System, device and method of controlling emission current of electron microscopeSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 1255US2026031301A1Pattern inspection system and method of pattern inspection using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 1354US2026023357A1Backup System, Backup Interface Module, and Base PlateSOLAREDGE TECHNOLOGIES LTD·Filed 2025·Application pending·0 cites
- 1453US12531028B2Display panel having improved light emission efficiencySAMSUNG DISPLAY CO LTD·Filed 2023·Granted Jan 20, 2026·0 cites·7 claims
- 1549US2026026311A1Semiconductor device inspection methodSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
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Identity basis: exact name match across USPTO filings. How scoring works →