Inventor · name-matched record
LEE MYUNGJUN
5 granted patents·2 pending applications·0 citations·filing 2023–2025
58Inventor score
Files withSAMSUNG ELECTRONICS CO LTD7
This identity is grouped by exact name match (no disambiguated inventor record was available for these filings) — it may combine same-named inventors.
Top patents by PatentIndex Score
7 records- 0169US12566144B2Semiconductor inspection apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2024·Granted Mar 3, 2026·0 cites·20 claims
- 0264US12578178B2Pupil image measuring device and methodSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Mar 17, 2026·0 cites·18 claims
- 0363US2026036916A1Analysis apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0459US12560529B2Imaging ellipsometer and method of measuring an overlay error using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Feb 24, 2026·0 cites·20 claims
- 0558US12535433B2Focus control method for spectroscopic measuring apparatus, inspection method for semiconductor device, and spectroscopic measuring apparatus for performing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Jan 27, 2026·0 cites·13 claims
- 0654US12561788B2Fluorescence microscopy metrology system and method of operating fluorescence microscopy metrology systemSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Feb 24, 2026·0 cites·20 claims
- 0750US2026023028A1Inspection apparatus and methodSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
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Identity basis: exact name match across USPTO filings. How scoring works →