Inventor · name-matched record
LI JUANE
0 granted patents·11 pending applications·0 citations·filing 2024–2025
Files withMICRON TECHNOLOGY INC11
This identity is grouped by exact name match (no disambiguated inventor record was available for these filings) — it may combine same-named inventors.
Top patents by PatentIndex Score
11 records- 0187US2026057927A1Temperature-adaptive scan frequency control for memory device state managementMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 0265US2026017141A1Redundant array of independent not-and (rain) block retirement handlingMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 0359US2026064532A1Early use of rain in read error handling processMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 0458US2026037399A1Handling program failure in zone memory systemMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 0558US2026064322A1System for generating virtual block stripes in a memory deviceMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 0658US2026037369A1Handling read failure in zone memory systemMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 0758US2026037140A1Handling read-verify failure in zone memory systemMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 0857US2026056837A1Selective codeword media scan systemMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 0955US2026037370A1Probablistically determining memory portions for select gate scanningMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 1052US2026038616A1Memory sub-system for block stripe selection and testingMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 1149US2026037135A1Determining data migration priorities in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when LI JUANE files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: exact name match across USPTO filings. How scoring works →