Inventor · name-matched record
ORON GADI
0 granted patents·2 pending applications·0 citations·filing 2024–2025
Files withAPPLIED MATERIALS ISRAEL LTD1ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH1
This identity is grouped by exact name match (no disambiguated inventor record was available for these filings) — it may combine same-named inventors.
Top patents by PatentIndex Score
2 records- 0169US2026063418A1Automatic computer-implemented detection of spot deformationAPPLIED MATERIALS ISRAEL LTD·Filed 2025·Application pending·0 cites
- 0256US2026066214A1Apparatus for a charged particle beam device, charged particle beam device, method of analyzing a magnetic lens for a charged particle beam device, and non-transitory mediumICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2024·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when ORON GADI files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: exact name match across USPTO filings. How scoring works →