Inventor · name-matched record
PARK SANGJINE
2 granted patents·7 pending applications·0 citations·filing 2021–2025
22Inventor score
Files withSAMSUNG ELECTRONICS CO LTD9
This identity is grouped by exact name match (no disambiguated inventor record was available for these filings) — it may combine same-named inventors.
Top patents by PatentIndex Score
9 records- 0185US2026040861A1Wafer drying apparatus, wafer processing system including the same, and wafer processing method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0262US2026011578A1Substrate cleaning apparatus and cleaning method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0362US2026058106A1Substrate processing apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0461US2026045453A1Substrate processing apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0557US2026101687A1Semiconductor chip and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0654US12578647B2Substrate rotating apparatus, substrate processing system including the same, and substrate processing method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Mar 17, 2026·0 cites·19 claims
- 0754US12523935B2Substrate processing method using low temperature developer and semiconductor device manufacturing apparatus using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Jan 13, 2026·0 cites·12 claims
- 0853US2026059849A1Semiconductor device and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0953US2026068584A1Apparatus for manufacturing semiconductor package and method of manufacturing semiconductor package using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when PARK SANGJINE files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: exact name match across USPTO filings. How scoring works →