Inventor · name-matched record
SOHN YOUNGHOON
5 granted patents·8 pending applications·0 citations·filing 2022–2025
58Inventor score
Files withSAMSUNG ELECTRONICS CO LTD13
This identity is grouped by exact name match (no disambiguated inventor record was available for these filings) — it may combine same-named inventors.
Top patents by PatentIndex Score
13 records- 0178US2026049928A1Terahertz signal measuring apparatus and measuring methodSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0266US12516979B2Optical module, spectroscopic device for hyperspectral imaging, and imaging measurement method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Granted Jan 6, 2026·0 cites·20 claims
- 0364US12566128B2Measurement apparatus and measurement method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Mar 3, 2026·0 cites·16 claims
- 0464US2026043751A1Inspection device and microprobe used thereinSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0564US2026063570A1Wafer inspection method and method of manufacturing semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0663US2026086042A1Defect detection devices and method for detecting defectsSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0762US12578467B2Light detection and ranging (LiDAR)-based inspection device and method of manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Mar 17, 2026·0 cites·20 claims
- 0860US12593659B2Spectroscopic device, spectroscopic method using the same, and method of fabricating semiconductor memory device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Mar 31, 2026·0 cites·20 claims
- 0958US12590900B2Wafer inspection apparatus using three-dimensional image and method of inspecting wafer using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Mar 31, 2026·0 cites·15 claims
- 1058US2026088247A1Scanning electron microscope with enhanced three-dimensional imagingSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 1157US2026029226A1Semiconductor measuring device and methodSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 1252US2026068583A1Substrate processing apparatus, method for manufacturing a semiconductor device including the same, and method for monitoring a substrate support device of the substrate processing apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 1351US2026063571A1Substrate inspection apparatus, substrate processing system including the same, and substrate inspection method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
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Identity basis: exact name match across USPTO filings. How scoring works →