Inventor · name-matched record
TAMAKI HIROKAZU
1 granted patent·1 pending application·0 citations·filing 2020–2023
1Inventor score
Technology areasH01J
This identity is grouped by exact name match (no disambiguated inventor record was available for these filings) — it may combine same-named inventors.
Top patents by PatentIndex Score
2 records- 0153US2026031300A1Standard sample for use in transmission electron microscope, method of preparing the same, method of adjusting transmission electron microscope, and method of analyzing observation image obtained with transmission electron microscopeHITACHI LTD·Filed 2023·Application pending·0 cites
- 0243US12525429B2Charged particle beam systemHITACHI HIGH TECH CORP·Filed 2020·Granted Jan 13, 2026·0 cites·16 claims
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Identity basis: exact name match across USPTO filings. How scoring works →