Inventor · name-matched record
ZEIDLER DIRK
1 granted patent·3 pending applications·0 citations·filing 2022–2025
1Inventor score
Technology areasH01J
Files withCARL ZEISS MULTISEM GMBH4
This identity is grouped by exact name match (no disambiguated inventor record was available for these filings) — it may combine same-named inventors.
Top patents by PatentIndex Score
4 records- 0191US2026081105A1Multiple particle beam microscope and associated method with fast autofocus around an adjustable working distanceCARL ZEISS MULTISEM GMBH·Filed 2025·Application pending·0 cites
- 0282US2026024721A1High throughput multi-beam charged particle inspection system with dynamic controlCARL ZEISS MULTISEM GMBH·Filed 2025·Application pending·0 cites
- 0371US2026074140A1Multi-beam charged particle microscope for inspection with increased throughputCARL ZEISS MULTISEM GMBH·Filed 2025·Application pending·0 cites
- 0451US12586749B2Certain improvements of multi-beam generating and multi-beam deflecting unitsCARL ZEISS MULTISEM GMBH·Filed 2022·Granted Mar 24, 2026·0 cites·20 claims
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Identity basis: exact name match across USPTO filings. How scoring works →