US10276698B2ActiveUtilityPatentIndex 52
Scalable process for the formation of self aligned, planar electrodes for devices employing one or two dimensional lattice structures
Est. expiryOct 21, 2035(~9.3 yrs left)· nominal 20-yr term from priority
H01L 29/778H01L 29/66045H01L 29/66742H01L 29/1606H01L 29/66969H01L 51/0048H01L 29/775H01L 29/24H01L 51/0545H01L 29/41725H01L 29/78696H10D 62/80H10D 64/251H10D 62/8303H10D 62/882H10D 30/6757H10D 30/47H10D 30/43H10D 30/031H10D 30/01H10D 99/00H10K 85/221H10K 10/466
52
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Claims
Abstract
A method of forming an electrical device that includes forming a gate dielectric layer over a gate electrode, forming source and drain electrodes on opposing sides of the gate electrode, wherein one end of the source and drain electrodes provides a coplanar surface with the gate dielectric, and positioning a 1D or 2D nanoscale material on the coplanar surface to provide the channel region of the electrical device.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1. A method of forming an electrical device comprising:
forming a gate dielectric layer on a single layer insulating substrate and an upper surface and sidewall surfaces of a gate electrode on the single layer insulating substrate;
forming source and drain electrodes on opposing sides of the gate electrode on the gate dielectric layer electrically isolating the source and drain electrodes from the single layer insulating substrate, wherein top surfaces of the source and drain electrodes provide a coplanar surface with a top surface of the gate dielectric layer; and
positioning a one dimensional (1D) nanoscale material, a two dimensional (2D) nanoscale material, or a combination thereof on the coplanar surface to provide a channel region of the electrical device.
2. The method of claim 1 , wherein forming the gate electrode comprises;
forming a photoresist layer on the single layer insulating substrate;
patterning the photoresist layer to provide an opening;
depositing a first electrically conductive material in the opening; and
removing a remaining portion of the photoresist layer.
3. The method of claim 1 , wherein the dielectric material that provides the gate dielectric layer is conformally deposited.
4. The method of claim 1 , wherein said forming the source and drain electrodes on opposing sides of the gate electrode comprises depositing a second electrically conductive material on the gate dielectric layer that is present over the gate electrode; and planarizing the second electrically conductive material to provide the source and drain electrodes having said coplanar surface with the gate dielectric layer.
5. The method of claim 1 , wherein the one dimensional (1D) nanoscale material, the two dimensional (2D) nanoscale material, or the combination thereof comprises carbon nanotubes, graphene, transition metal dichalcogenides, black phosphorus or a combination thereof.
6. The method of claim 1 , wherein positioning the one dimensional (1D) nanoscale material, the two dimensional (2D) nanoscale material, or the combination thereof comprises in-situ material growth, chemical vapor deposition, electric field-assisted assembly from solution, or material exfoliation and transfer.
7. A method of forming an electrical device comprising:
forming a gate dielectric layer on a planarized single layer insulating substrate and an upper surface and sidewall surfaces of a gate electrode on the planarized single layer insulating substrate;
forming source and drain electrodes on opposing sides of the gate electrode on the gate dielectric layer electrically isolating the source and drain electrodes from the planarized single layer insulating substrate, wherein top surfaces of the source and drain electrodes provide a coplanar surface with a top surface of the gate dielectric layer; and
positioning a one dimensional (1D) nanoscale material, a two dimensional (2D) nanoscale material, or a combination thereof on the coplanar surface to provide a channel region of the electrical device, wherein the 1D or 2D nanoscale material comprises carbon nanotubes, graphene, black phosphorus or a combination thereof.
8. The method of claim 7 , wherein forming the gate electrode comprises;
forming a photoresist layer on the planarized single layer insulating substrate;
patterning the photoresist layer to provide an opening;
depositing a first electrically conductive material in the opening; and
removing a remaining portion of the photoresist layer.
9. The method of claim 7 , wherein said forming the source and drain electrodes on opposing sides of the gate electrode comprises depositing a second electrically conductive material on the gate dielectric layer that is present over the gate electrode.
10. The method of claim 9 further comprising planarizing the second electrically conductive material to provide the source and drain electrodes having said coplanar surface with the gate dielectric layer.
11. The method of claim 7 , wherein positioning the one dimensional (1D) nanoscale material, the two dimensional (2D) nanoscale material, or the combination thereof comprises in-situ material growth, chemical vapor deposition, electric field-assisted assembly from solution, or material exfoliation and transfer.Cited by (0)
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