Phase microscopy system and method

Abstract

A phase microscopy system and method are provided in the present disclosure. The system includes: an optical source, configured to generate collimated light; an object arrangement component, configured to provide a mask and a sample; a microscopic imaging component, including a microscope and a sensor, the microscope being configured to project light that passes successively through the mask and the sample into the sensor to capture an image; and a control component, configured to reconstruct phase information of the sample based on the image through both the sample and the mash and a pre-stored reference image of the mask, in which the pre-stored reference image is pre-acquired by the phase microscopy system without providing the sample under a same light condition. With the present disclosure, dynamic phase information of the microscopic sample can be acquired accurately and rapidly with high resolution.

What is claimed is: 
     
       1. A phase microscopy system, comprising:
 an optical source, configured to generate collimated light; 
 an object arrangement component, configured to provide a mask and to provide a sample, wherein:
 the mask has a reference pattern configured to modulate amplitude of the light; and 
 the sample is configured to modulate phase of the light; 
 
 a first optical path along a direction of light propagation passing from the optical source, through the mask and without the sample; 
 a second optical path along the direction of light propagation passing from the optical source, through the mask and through the sample, wherein the sample is positioned behind the mask in the direction of light propagation; 
 a microscopic imaging component, comprising a microscope and a sensor, which are configured to:
 pre-acquire a reference image by projecting light that passes along the first optical path through the mask and into the sensor such that the sensor captures the reference image; and 
 acquire an image by projecting light that passes along the second optical successively through the mask and the sample and into the sensor such that the sensor captures the image, 
 wherein the reference image is pre-acquired by the phase microscopy system under a same light condition as the image, but without the sample; and 
 
 a control component, configured to reconstruct phase information of the sample based on a distortion of each pixel in the reference image acquired through the mask relative to a corresponding pixel in the image acquired through both the sample and the mask. 
 
     
     
       2. The phase microscopy system according to  claim 1 , wherein the object arrangement component comprises two object arrangement components provided successively, and one of the two object arrangement components is configured to provide the mask and the other of the two object arrangement components is configured to provide the sample. 
     
     
       3. The phase microscopy system according to  claim 2 , wherein the object arrangement component configured to provide the sample is behind the object arrangement component configured to provide the mask along the direction of light propagation. 
     
     
       4. The phase microscopy system according to  claim 1 , wherein, a focal position of the microscopic imaging component is close to the mask with the reference pattern. 
     
     
       5. The phase microscopy system according to  claim 1 , wherein the sensor is further configured to record a video. 
     
     
       6. A phase microscopy method, applied to a phase microscopy system, wherein the system comprises:
 an optical source, configured to generate collimated light; 
 an object arrangement component, configured to provide a mask and to provide a sample, wherein:
 the mask has a reference pattern configured to modulate amplitude of the light; and 
 the sample is configured to modulate phase of the light; 
 
 a first optical path along a direction of light propagation passing from the optical source, through the mask and without the sample; 
 a second optical path along the direction of light propagation passing from the optical source, through the mask and through the sample, wherein the sample is positioned behind the mask in the direction of light propagation; 
 a microscopic imaging component, comprising a microscope and a sensor, which are configured to:
 pre-acquire a reference image by projecting light that passes along the first optical path through the mask and into the sensor such that the sensor captures the reference image; and 
 acquire an image by projecting light that passes along the second optical successively through the mask and the sample and into the sensor such that the sensor captures the image, 
 wherein the reference image is pre-acquired by the phase microscopy system under a same light condition as the image, but without the sample; and 
 
 a control component, configured to reconstruct phase information of the sample based on a distortion of each pixel in the reference image acquired through the mask relative to a corresponding pixel in the image acquired through both the sample and the mask, 
 
       and the method comprises:
 adjusting, by the control component, a field of vision of the system to a first area without the sample, corresponding to the first optical path; 
 controlling, by the control component, the microscopic imaging component to acquire the reference image based on the first area; 
 adjusting, by the control component, the field of vision of the system to a second area with the sample under the same light condition, corresponding to the second optical path; 
 controlling, by the control component, the microscopic imaging component to acquire the image based on the second area; 
 acquiring, by the control component, a correspondence map between the image and the reference image; and 
 reconstructing, by the control component, phase information of the sample based on the correspondence map and an established model of the optical paths of the system, which comprises reconstructing, by the control component, the phase information of the sample based on a distortion of each pixel in the pre-stored reference image relative to a corresponding pixel in the image and the established model of the optical paths of the system. 
 
     
     
       7. The phase microscopy method according to  claim 6 , which further comprises:
 controlling, by the control component, the microscopic imaging component to acquire a video based on the second area; and 
 acquiring, by the control component, the correspondence maps between each frame image in the video and the reference image; and 
 reconstructing, by the control component, a phase video of the sample based on the correspondence maps and the established model of the optical path of the system. 
 
     
     
       8. The phase microscopy method according to  7 , wherein the correspondence map between the image and the reference image comprises a distortion of the pixel in the reference image relative to the corresponding pixel in the image. 
     
     
       9. The phase microscopy method according to  7 , wherein the correspondence map between each frame image in the video and the reference image comprises a distortion of the pixel in the reference image relative to the corresponding pixel in each frame image in the video.