Radiographic and computed tomography inspection anti-counterfeit security

Abstract

A structure for preventing a scan by a beam is provided. The structure includes a primary material forming the structure. The primary material includes a first mass attenuation coefficient enabling the primary material to be penetrated by the beam. The structure also includes a matrix of dense particles within the primary material. The dense particles include secondary materials different than the primary material. The secondary materials comprise a subsequent mass attenuation coefficient that is greater than the first mass attenuation coefficient of the primary material. The subsequent mass attenuation coefficient enables the dense particles to attenuate the beam to distort the scan.

What is claimed is: 
     
       1. A structure for preventing a scan by a beam, the structure comprising:
 a primary material forming the structure, the primary material comprising a first mass attenuation coefficient enabling the primary material to be penetrated by the beam; and 
 a matrix of particles within the primary material to provide scattering or attenuating of the beam to distort the scan, 
 wherein the particles comprise one or more secondary materials different than the primary material, 
 wherein the one or more secondary materials comprises a plurality of crystal particles distributed in three-dimensional modified matrix with a varying number of the plurality of crystal particles located in offset positions and with a varying number of grouped particles, a subset of the plurality of crystal particles comprising oblong shaped crystal particles, and a second subset of the plurality of crystal particles comprises round sphered crystal particles, 
 wherein the one or more secondary materials comprises at least one subsequent mass attenuation coefficient that is greater than the first mass attenuation coefficient of the primary material, and 
 wherein the at least one subsequent mass attenuation coefficient enables the particles to scatter or attenuate the beam to distort the scan comprising the varying number of the grouped particles being positioned within the structure to prevent a view of a design feature or internal component to the structure by the scan, 
 wherein the matrix of particles comprises one or more gaps to enable geometric dimensioning and tolerancing measurements and inspection of critical areas of the structure, one or more vacant areas that include no particles to reveal a view of a first design feature of the structure, one or more secondary materials located in at least one cluster implemented to distort a view of a second design feature of the structure, and one or more vacant areas that include no particles to mislead a scan and analysis of the view of the first and second design features. 
 
     
     
       2. The structure of  claim 1 , wherein the primary material comprises aluminum and the one or more secondary materials comprises tungsten, copper, nickel, or iron. 
     
     
       3. The structure of  claim 1 , wherein the matrix of particles is uniform. 
     
     
       4. The structure of  claim 1 , wherein the matrix of particles comprises one or more secondary materials located in offset positions. 
     
     
       5. The structure of  claim 1  comprises a component, a part, or a tool utilized in an electro-mechanical system of an aircraft. 
     
     
       6. The structure of  claim 1 , wherein the primary material is layered via additive manufacturing technologies to form the structure. 
     
     
       7. The structure of  claim 1 , wherein the primary material is produced via casting technologies to form the structure.