US10361313B2ActiveUtilityA1

Electronic device and methods of fabricating the same

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Assignee: ELECTRONICS & TELECOMMUNICATIONS RES INSTPriority: Jul 13, 2016Filed: Mar 22, 2017Granted: Jul 23, 2019
Est. expiryJul 13, 2036(~10 yrs left)· nominal 20-yr term from priority
H10P 95/00H10P 14/47H10D 64/0114H01L 29/78618H01L 29/66969H01L 29/66742H01L 29/66045H01L 29/24H01L 21/47635H01L 29/78684H01L 29/78696H01L 21/043H01L 29/1606H01L 21/445H01L 29/45H01L 29/772H10D 64/62H10D 62/882H10D 62/119H10D 62/213H10D 99/00H10D 62/8303H10D 62/80H10D 30/6757H10D 30/6741H10D 30/47H10D 30/031H10D 30/01H10D 30/00H10D 30/6713H10W 20/031H10P 95/90H10P 10/12
46
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References
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Claims

Abstract

Disclosed are an electronic device and a method of fabricating the same. The method of fabricating an electronic device comprises providing on a substrate a channel layer including a two-dimensional material, providing a metal fiber layer on a first surface of a conductive layer, providing the metal fiber layer on the channel layer, and performing a thermal treatment process to form a junction layer where a portion of the metal fiber layer is covalently bonded to a portion of the channel layer.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
       1. A method of fabricating an electronic device, the method comprising:
 providing on a substrate a channel layer including a two-dimensional material; 
 providing a metal fiber layer on a first surface of a conductive layer; 
 placing the conductive layer and the metal fiber layer on the channel layer, such that the first surface of the conductive layer faces the channel layer and the metal fiber layer is provided on the channel layer; and 
 covalently bonding a portion of the metal fiber layer to a portion of the channel layer by a thermal treatment process, and forming a junction layer between the metal fiber and the channel layer. 
 
     
     
       2. The method of  claim 1 , wherein providing the metal fiber layer comprises electro-spinning a spray solution including an ohmic metal material on the first surface. 
     
     
       3. The method of  claim 2 , wherein the ohmic metal material comprises at least one of Mo, W, Ni, Pd, or Ti. 
     
     
       4. The method of  claim 1 , wherein the metal fiber layer is provided in a grid shape or an irregular shape on the first surface. 
     
     
       5. The method of  claim 1 , wherein the two-dimensional material comprises at least one of molybdenum disulfide (MoS2), tungsten disulfide (WS2), molybdenum diselenide (MoSe2), tungsten diselenide (WSe2), black phosphor, or graphene. 
     
     
       6. The method of  claim 1 , further comprising providing a gate insulating layer on the channel layer. 
     
     
       7. The method of  claim 6 , further comprising etching a portion of the conductive layer and a portion of the metal fiber layer, wherein the portions of the conductive layer and the metal fiber layer are adjacent to a boundary of the gate insulating layer. 
     
     
       8. The method of  claim 1 , wherein the conductive layer comprises at least one of graphene, graphite, or carbon nanotube. 
     
     
       9. The method of  claim 1 , wherein
 the conductive layer is provided on a collector substrate, and 
 the method further comprises, after providing the metal fiber layer on the first surface, separating the conductive layer from the collector substrate.

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