Apparatuses and methods for measuring a clearance

Abstract

The present disclosure provides an apparatus and method for measuring a clearance. The apparatus comprises: a first measurement component configured to be mounted on a first object in a mounted state thereof, so that a first measurement surface of the first measurement component is aligned with a first surface to be measured of the first object; and a second measurement component configured to be mounted on a second object in a mounted state thereof, so that a second measurement surface of the second measurement component is aligned with a second surface to be measured of the second object, wherein the first measurement component comprises a measurement instrument configured to measure a first distance between the measurement instrument and the first measurement surface and a second distance between the measurement instrument and the second measurement surface, wherein the clearance is calculated based on the first distance and the second distance.

We claim: 
     
       1. An apparatus for measuring a clearance defined by a first surface of a first object and a second surface of a second object, the apparatus comprising:
 a first measurement component configured to be mounted on the first object in a mounted state thereof, so that a first measurement surface of the first measurement component is aligned with the first surface of the first object; and 
 a second measurement component configured to be mounted on the second object in a mounted state thereof, so that a second measurement surface of the second measurement component is aligned with the second surface of the second object, 
 wherein the first measurement component comprises a measurement instrument configured to measure a first distance between the measurement instrument and the first measurement surface of the first measurement component and a second distance between the measurement instrument and the second measurement surface of the second measurement component, wherein the clearance is calculated based on the first distance and the second distance; 
 wherein the first measurement component further comprises: 
 a first body defining the first measurement surface; 
 a first fixing plate disposed on a front surface of the first body; and 
 a first stopper baffle connected to the first fixing plate and aligned with the first measurement surface, wherein the first stopper baffle is able to rotate in a plane parallel to the first measurement surface around a junction between the first stopper baffle and the first fixing plate. 
 
     
     
       2. The apparatus according to  claim 1 , wherein when the first measurement component is in the mounted state, one end of the first stopper baffle protrudes from a rear surface of the first body along the first measurement surface. 
     
     
       3. The apparatus according to  claim 1 , wherein the first measurement component further has a measurement state, and the first stopper baffle is orthogonal to a line from the measurement instrument which is perpendicular to the first measurement surface when the first measurement component is in the measurement state. 
     
     
       4. The apparatus according to  claim 1 , wherein the measurement instrument determines the first distance by measuring a distance between the measurement instrument and the first stopper baffle. 
     
     
       5. The apparatus according to  claim 1 , wherein the first body has a slide rail provided thereon, and the first fixing plate and/or the measurement instrument are movably disposed on the first body through the slide rail. 
     
     
       6. The apparatus according to  claim 1 , wherein the second measurement component further comprises:
 a second body defining the second measurement surface; and 
 a second stopper baffle connected to the second body and aligned with the second measurement surface, wherein the second stopper baffle is able to rotate in a plane parallel to the second measurement surface around a junction between the second stopper baffle and the second body. 
 
     
     
       7. The apparatus according to  claim 6 , wherein when the second measurement component is in the mounted state, one end of the second stopper baffle protrudes from a rear surface of the second body along the second measurement surface. 
     
     
       8. The apparatus according to  claim 6 , wherein the measurement instrument determines the second distance by measuring a distance between the measurement instrument and the second body. 
     
     
       9. The apparatus according to  claim 1 , wherein the measurement instrument is a contact measurement instrument comprising a contact protruding from the measurement instrument in a direction toward the first measurement surface. 
     
     
       10. The apparatus according to  claim 1 , wherein the first measurement component and the second measurement component are mounted on the first object and the second object by magnetic force, respectively. 
     
     
       11. A method for measuring a clearance using the apparatus for measuring a clearance according to  claim 1 , wherein the second measurement component further comprises: a second body defining the second measurement surface and a second stopper baffle connected to the second body and aligned with the second measurement surface, wherein the second stopper baffle is able to rotate in a plane parallel to the second measurement surface around a junction between the second stopper baffle and the second body, the method comprising:
 fixing the first measurement component to the front surface of the first object in a case that the first measurement component is in a mounted state, so that the first stopper baffle is in close contact with the first surface to be measured of the first object; 
 fixing the second measurement component to the front surface of the second object in a case that the second measurement component is in a mounted state, so that the second stopper baffle is in close contact with the second surface to be measured of the second object; 
 measuring a distance between the measurement instrument and the first stopper baffle to determine the first distance in a case that the first measurement component is in a measurement state; 
 measuring a distance between the measurement instrument and the second body of the second measurement component to determine the second distance in a case that the first stopper baffle is moved away so that the first measurement component is not in the measurement state; and 
 calculating the clearance defined by the first surface to be measured of the first object and the second surface to be measured of the second object based on the first distance and the second distance. 
 
     
     
       12. The method according to  claim 11 , wherein when the first measurement component is in the mounted state, one end of the first stopper baffle protrudes from a rear surface of the first body along the first measurement surface. 
     
     
       13. The method according to  claim 11 , wherein the first stopper baffle is orthogonal to a line from the measurement instrument which is perpendicular to the first measurement surface when the first measurement component is in a measurement state. 
     
     
       14. The method according to  claim 11 , wherein the first body has a slide rail provided thereon, and the first fixing plate and/or the measurement instrument are movably disposed on the first body through the slide rail. 
     
     
       15. The method according to  claim 11 , wherein when the second measurement component is in the mounted state, one end of the second stopper baffle protrudes from a rear surface of the second body along the second measurement surface. 
     
     
       16. The method according to  claim 11 , wherein the measurement instrument is a contact measurement instrument comprising a contact protruding from the measurement instrument in a direction toward the first measurement surface. 
     
     
       17. The method according to  claim 11 , wherein the first measurement component and the second measurement component are mounted on the first object and the second object by magnetic force, respectively.