US10669297B2ActiveUtilityA1

Process for the generation of thin inorganic films

48
Assignee: BASF SEPriority: Dec 2, 2015Filed: Nov 30, 2016Granted: Jun 2, 2020
Est. expiryDec 2, 2035(~9.4 yrs left)· nominal 20-yr term from priority
C09D 1/00C09D 5/021C23C 16/45553C01B 33/06C07F 15/065H01L 21/28556H01L 21/76841C23C 16/45525H01L 21/28518C23C 16/18H10P 14/43H10D 64/0112H10W 20/032C23C 16/22
48
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References
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Claims

Abstract

The present invention is in the field of processes for the generation of thin inorganic films on substrates, in particular atomic layer deposition processes. The present invention relates to a process comprising bringing a compound of general formula (I) into the gaseous or aerosol state and depositing the compound of general formula (I) from the gaseous or aerosol state onto a solid substrate, wherein M is Mn, Ni or Co, X is a ligand which coordinates M, n is 0, 1, or 2, R 1 , R 2 are an alkyl group, an alkenyl group, an aryl group or a silyl group, m is 1, 2, or 3, R 3 , R 4 , and R 5 are an alkyl group, an alkenyl group, an aryl group, an alkoxy group, or an aryloxy group, and p is 1, 2 or 3.

Claims

exact text as granted — not AI-modified
The invention claimed is: 
     
       1. A process, comprising:
 bringing a compound of formula (I): 
 
       
         
           
           
               
               
           
         
         into a gaseous or aerosol state, and 
         depositing the compound from the gaseous or aerosol state onto a solid substrate, thereby forming a deposited compound, 
         wherein 
         M is Mn, Ni or Co, 
         X is a ligand which coordinates M, 
         n is 0, 1, or 2, 
         R 1 , R 2  are an alkyl group, an alkenyl group, an aryl group or a silyl group, 
         m is 1, 2, or 3, 
         R 3 , R 4 , and R 5  are an alkyl group, an alkenyl group, an aryl group, an alkoxy group, or an aryloxy group, and 
         p is 1, 2 or 3. 
       
     
     
       2. The process according to  claim 1 ,
 wherein only two of R 3 , R 4  and R 5  are the same or all R 3 , R 4  and R 5  are different to each other. 
 
     
     
       3. The process according to  claim 1 ,
 wherein n is 0, 
 m is 2 and 
 p is 1. 
 
     
     
       4. The process according to  claim 1 ,
 wherein R 1  and R 2  are a silyl group. 
 
     
     
       5. The process according to  claim 1 ,
 wherein R 3 , R 4  and R 5  are methyl, ethyl, iso-propyl or tert-butyl. 
 
     
     
       6. The process according to  claim 1 ,
 wherein M is Co. 
 
     
     
       7. The process according to  claim 1 , further comprising:
 chemisorbing the compound on a surface of the solid substrate. 
 
     
     
       8. The process according to  claim 1 , further comprising:
 decomposing the deposited compound by removing all ligands. 
 
     
     
       9. The process according to  claim 8 , further comprising:
 exposing the deposited compound to a reducing agent. 
 
     
     
       10. The process according to  claim 8 ,
 wherein a sequence of the depositing the compound onto the solid substrate and the decomposing the deposited compound is performed at least twice. 
 
     
     
       11. A process for forming a film on a solid substrate, comprising:
 applying, to the solid substrate, a compound of formula (I), 
 
       
         
           
           
               
               
           
         
         wherein M is Mn, Ni or Co, 
         X is a ligand which coordinates M, 
         n is 0, 1, or 2, 
         R 1 , R 2  are an alkyl group, an alkenyl group, an aryl group or a silyl group, 
         m is 1, 2, or 3, 
         R 3 , R 4 , and R 5  are an alkyl group, an alkenyl group, an aryl group, an alkoxy group, or an aryloxy group, and 
         p is 1, 2 or 3.

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