US10826489B1ActiveUtility
Selection circuit
Est. expiryJun 6, 2039(~12.9 yrs left)· nominal 20-yr term from priority
G11C 16/30G11C 5/146G11C 7/1087H03K 17/687
57
PatentIndex Score
1
Cited by
12
References
21
Claims
Abstract
The present disclosure relates to a structure including a voltage selection circuit which includes a first device and a second device, the voltage selection circuit is configured to output a higher voltage of a first supply voltage and a second supply voltage through one of the first device and the second device, and a voltage difference between the first supply voltage and the second supply voltage is less than a threshold voltage.
Claims
exact text as granted — not AI-modifiedWhat is claimed:
1. A voltage selection comprising:
a first device and a second device connected to output an output signal, wherein the voltage selection circuit is configured to output a higher voltage of a first supply voltage and a second supply voltage through one of the first device and the second device, and wherein a voltage difference between the first supply voltage and the second supply voltage is less than a threshold voltage; and
a third device comprising an NWELL having a same voltage potential as the output signal.
2. The voltage selection circuit of claim 1 , wherein the first device is a PMOS transistor which has a source at the voltage potential of the first supply voltage.
3. The voltage selection circuit of claim 2 , wherein the second device is a PMOS transistor which has a source at the voltage potential of the second supply voltage.
4. The voltage selection circuit of claim 3 , wherein:
a drain of the first device is connected to a drain of the second device and;
the drain of the first device and the drain of the second device provide the output signal.
5. The voltage selection circuit of claim 4 , wherein the third device comprises:
a source at a same voltage potential as the second supply voltage;
a gate at a same voltage potential as the first supply voltage; and
a drain connected to a gate of a fourth device.
6. The voltage selection circuit of claim 4 , further comprising a fourth device comprising:
an NWELL at a same voltage potential as the output signal;
a source at a same voltage potential as the first supply voltage;
a gate at a same voltage potential as the second supply voltage; and
a drain connected to a gate of the third device.
7. The voltage selection circuit of claim 6 , further comprising a gate bias circuitry which includes:
a fifth device with an NWELL at the same voltage potential as the output signal and a source at the same voltage potential as the first supply voltage; and
a sixth device with an NWELL at the same voltage potential as the output signal and a source at the same voltage potential as the second supply voltage.
8. The voltage selection circuit of claim 7 , further comprising disabling the second device by forcing a gate node of the second device to a value of the first supply voltage.
9. The voltage selection circuit of claim 7 , further comprising disabling the first device by forcing a gate node of the first device to a value of the second supply voltage.
10. A circuit comprising:
a p-channel field effect transistor circuit comprising a first device and a second device such that the p-channel field effect transistor circuit is configured to output a higher voltage of a first supply voltage and a second supply voltage through one of the first device and the second device, wherein the first device and the second device are connected to output an output signal; and
a gate control circuit comprising
a third device comprising
an NWELL at a same voltage potential as the output signal,
a source at a same voltage potential as the second supply voltage, and
a drain at the same voltage potential as a gate of a fourth device, and
the fourth device comprising
an NWELL at the same voltage potential as the output signal,
a source at the same voltage potential as the first supply voltage, and
a drain at the same voltage potential as the gate of the third device, and
a voltage difference between the first supply voltage and the second supply voltage is less than a threshold voltage.
11. The circuit of claim 10 , wherein:
the first device is a PMOS; and
the PMOS transistor comprises a source at the same voltage potential as the first supply voltage.
12. The circuit of claim 11 , wherein:
the second device is a PMOS transistor; and
the PMOS transistor comprises a source at the same voltage potential as the second supply voltage.
13. The circuit of claim 11 , wherein each of the first device and the second device includes a drain at the same voltage potential as the output signal.
14. The circuit of claim 12 , further comprising a gate bias circuit, wherein:
the gate bias circuit comprises a fifth device and a sixth device;
the fifth device comprises
an NWELL at the same voltage potential as the output signal, and
a source at the same voltage potential as the first supply voltage; and
the sixth device comprises
an NWELL at the same voltage potential as the output signal, and
a source at the same voltage potential as the second supply voltage.
15. The circuit of claim 10 , further comprising disabling the second device by forcing a gate node of the second device to a value of the first supply voltage.
16. The circuit of claim 10 , further comprising disabling the first device by forcing a gate node of the first device to a value of the second supply voltage.
17. The circuit of claim 10 , further comprising a standby control circuit comprising a level translator, a NOR gate, a buffer, and an inverter.
18. A method, comprising:
generating a bias voltage in response to a voltage difference between a first supply voltage and a second supply voltage being less than a threshold voltage;
outputting via a first device and a second device of a voltage selection circuit an output signal to a higher voltage of the first supply voltage and the second supply voltage in response to the generated bias voltage; and
providing the output signal to an NWELL of a third device of the voltage selection circuit.
19. The method of claim 18 , further comprising disabling the second device by forcing a gate node of the second device to a value of the first supply voltage.
20. The method of claim 18 , further comprising disabling the first device by forcing a gate node of the first device to a value of the second supply voltage.
21. The method of claim 18 , further comprising:
supplying the first supply voltage or the second supply voltage to a source of the third device; and
supplying the first supply voltage or the second supply voltage to a gate of the third device.Cited by (0)
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