US10861684B2ActiveUtilityA1

Sputtering target

70
Assignee: SUMITOMO CHEMICAL COPriority: Mar 29, 2017Filed: Mar 26, 2018Granted: Dec 8, 2020
Est. expiryMar 29, 2037(~10.7 yrs left)· nominal 20-yr term from priority
C23C 14/165C23C 14/3407H01J 37/3423C23C 14/35C23C 14/14H01J 37/3405H01J 37/3426
70
PatentIndex Score
0
Cited by
12
References
5
Claims

Abstract

A sputtering target comprising a target material, wherein a sputtering face of the target material has a ramp provided to reduce a thickness of the target material at a position where erosion concentrates most intensively during sputtering.

Claims

exact text as granted — not AI-modified
The invention claimed is: 
     
       1. A sputtering target comprising a target material, wherein a sputtering face of the target material has a ramp provided, to reduce a thickness of the target material, at a region at a position of 80% or more depth against the deepest position of an erosion to be generated during sputtering, wherein the thickness of the ramp is 0.3 mm to 10 mm. 
     
     
       2. The sputtering target according to  claim 1 ,
 wherein the sputtering face has a circular shape, and 
 the ramp is formed at a position in a range of 60% or more and less than 90% of a diameter of the sputtering face so as to reduce the thickness of the target material toward a peripheral part of the sputtering face in the radical direction of the sputtering face. 
 
     
     
       3. The sputtering target according to  claim 2 , wherein the target material includes a flat circular first region positioned at a center of the sputtering face, a flat ring-shaped second region positioned around the first region, and a flat ring-shaped third region positioned around the second region,
 wherein the ramp exists between the second region and the third region, and a thickness of the third region is smaller than a thickness of the second region; 
 wherein the thickness of the third region is equal to or larger than a thickness of the first region and a diameter of the first region accounts for 14% or more and less than 60% of the diameter of the sputtering face; and 
 wherein an inner diameter of the third region accounts for less than 90% of the diameter of the sputtering face. 
 
     
     
       4. The sputtering target according to  claim 3 , wherein a ratio of the thickness of the third region to a ring width of the third region is in a range of 0.1 to 1.1. 
     
     
       5. The sputtering target according to  claim 4 , wherein the ratio is in a range of 0.1 to 0.6.

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