US11378534B2ActiveUtilityA1

Method for measuring change of cell in real time and device therefor

78
Assignee: SAMSUNG ELECTRONICS CO LTDPriority: Oct 31, 2016Filed: Oct 31, 2016Granted: Jul 5, 2022
Est. expiryOct 31, 2036(~10.3 yrs left)· nominal 20-yr term from priority
G01N 33/483G01N 27/122G01N 27/023C12M 41/46G01N 27/74
78
PatentIndex Score
3
Cited by
19
References
21
Claims

Abstract

Provided are a method and a device capable of: generating a first alternating current magnetic field passing through a chamber having a cell disposed therein, by using a plurality of primary coils arranged on a first plane; receiving a second alternating current magnetic field by using a plurality of secondary coils arranged on a second plane; and measuring an impedance change of a cell by using the first alternating current magnetic field and the second alternating current magnetic field.

Claims

exact text as granted — not AI-modified
The invention claimed is: 
     
       1. A device for measuring a change in a cell in real time, the device comprising:
 a chamber in which the cell is arranged; 
 an induced magnetic field generator configured to generate a first alternating magnetic field passing through the chamber using a plurality of primary coils arranged on a first plane; 
 an induced magnetic field receiver configured to receive a second alternating magnetic field using a plurality of secondary coils arranged on a second plane; and 
 a controller configured to control the induced magnetic field generator and the induced magnetic field receiver and measure an impedance change of the cell using the first alternating magnetic field and the second alternating magnetic field, 
 wherein the second alternating magnetic field is a magnetic field obtained by allowing the first alternating magnetic field to pass through the chamber. 
 
     
     
       2. The device of  claim 1 , wherein the plurality of primary coils are arranged in an array on the first plane and the plurality of secondary coils are arranged on the second plane parallel to the first plane in the same form as the plurality of primary coils. 
     
     
       3. The device of  claim 1 , wherein the controller is configured to determine a plurality of coil pairs using the plurality of primary coils and the plurality of secondary coils and individually control an operation of each of the plurality of coil pairs,
 wherein the plurality of coil pairs comprise a first coil included in the plurality of primary coils and a second coil among the plurality of secondary coils disposed in a position corresponding to the first coil. 
 
     
     
       4. The device of  claim 1 , wherein the controller is configured to sequentially control each of a plurality of coil pairs according to a predetermined time interval. 
     
     
       5. The device of  claim 1 , wherein the controller is configured to measure the impedance change of the cell while rotating the first plane and the second plane by a predetermined angle. 
     
     
       6. The device of  claim 1 , wherein the controller is configured to measure the impedance change of the cell by measuring changes in parameters of the first alternating magnetic field and the second alternating magnetic field. 
     
     
       7. The device of  claim 1 , wherein the controller is configured to measure initial parameters of the first alternating magnetic field and the second alternating magnetic field in a state where the cell is not disposed in the chamber and measure the impedance change of the cell based on the measured initial parameters. 
     
     
       8. The device of  claim 1 , wherein the controller is configured to measure the impedance change of the cell using at least one of an amplitude, a phase, and a waveform of the first alternating magnetic field and the second alternating magnetic field. 
     
     
       9. The device of  claim 1 , wherein the controller is configured to determine a change in at least one of a number, a size, and a type of the cell based on the impedance change of the cell. 
     
     
       10. The device of  claim 1 , wherein the induced magnetic field generator comprises an inverter configured to convert a direct current (DC) into an alternating current (AC), the plurality of primary coils, and a plurality of switches corresponding to the plurality of primary coils, respectively. 
     
     
       11. The method of  claim 1 , wherein the induced magnetic field receiver comprises the plurality of secondary coils, a plurality of switches corresponding to the plurality of secondary coils, respectively, and a rectifier configured to convert alternating current (AC) power into direct current (DC) power. 
     
     
       12. A method of measuring a change in a cell in real time, the method comprising:
 generating a first alternating magnetic field passing through a chamber in which the cell is disposed using a plurality of primary coils arranged on a first plane; 
 receiving a second alternating magnetic field using a plurality of secondary coils arranged on a second plane; and 
 measuring an impedance change of the cell using the first alternating magnetic field and the second alternating magnetic field, 
 wherein the second alternating magnetic field is a magnetic field obtained by allowing the first alternating magnetic field to pass through the chamber. 
 
     
     
       13. The method of  claim 12 , wherein the plurality of primary coils are arranged in an array on the first plane and the plurality of secondary coils are arranged on the second plane parallel to the first plane in the same form as the plurality of primary coils. 
     
     
       14. The method of  claim 12 , further comprising:
 determining a plurality of coil pairs using the plurality of primary coils and the plurality of secondary coils; and 
 individually controlling an operation of each of the plurality of coil pairs, 
 wherein the plurality of coil pairs comprise a first coil included in the plurality of primary coils and a second coil among the plurality of secondary coils disposed in a position corresponding to the first coil. 
 
     
     
       15. The method of  claim 14 , wherein the controlling comprises sequentially controlling each of the plurality of coil pairs according to a predetermined time interval. 
     
     
       16. The method of  claim 12 , further comprising measuring the impedance change of the cell while rotating the first plane and the second plane by a predetermined angle. 
     
     
       17. The method of  claim 12 , further comprising measuring the impedance change of the cell by measuring changes in parameters of the first alternating magnetic field and the second alternating magnetic field. 
     
     
       18. The method of  claim 12 , further comprising measuring initial parameters of the first alternating magnetic field and the second alternating magnetic field in a state where the cell is not disposed in the chamber and measuring the impedance change of the cell based on the measured initial parameters. 
     
     
       19. The method of  claim 12 , wherein the measuring comprises measuring the impedance change of the cell using at least one of an amplitude, a phase, and a waveform of the first alternating magnetic field and the second alternating magnetic field. 
     
     
       20. The method of  claim 12 , further comprising determining a change in at least one of a number, a size, and a type of the cell based on the impedance change of the cell. 
     
     
       21. A non-transitory computer-readable recording medium having recorded thereon one or more programs comprising instructions for executing the method of  claim 12 .

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