P
US11466356B2ActiveUtilityPatentIndex 52

Optical element having metallic seed layer and aluminum layer, and method for producing same

Assignee: FRAUNHOFER GES FORSCHUNGPriority: Aug 16, 2019Filed: Aug 14, 2020Granted: Oct 11, 2022
Est. expiryAug 16, 2039(~13.1 yrs left)· nominal 20-yr term from priority
Inventors:STEMPFHUBER SVENGÄBLER DIETERSCHMITT PAULMUNZERT PETERSCHWINDE STEFAN
G02B 5/0808C23C 14/025G02B 5/0891C23C 14/14C23C 14/021G02B 1/14C23C 14/30C23C 14/58C23C 14/16G02B 5/08
52
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Cited by
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References
18
Claims

Abstract

A method for producing an aluminum layer is provided. The method includes depositing a metallic seed layer on a substrate, the seed layer having a thickness of not more than 5 nm, and also includes applying the aluminum layer to the seed layer, wherein the aluminum layer has a thickness of more than 30 nm. Further, an optical element, which can be a mirror layer, is provided including the metallic seed layer and the aluminum layer.

Claims

exact text as granted — not AI-modified
The invention claimed is: 
     
       1. A method for producing an optical element including a substrate, a metallic seed layer on the substrate and an aluminum layer deposited on a side of the metallic seed layer that faces away from the substrate, wherein the aluminum layer directly adjoins the metallic seed layer and the aluminum layer has a root mean square roughness of less than 0.7 nm, the method comprising:
 depositing the metallic seed layer on the substrate, the metallic seed layer having a thickness of not more than 5 nm; and 
 applying the aluminum layer directly to the metallic seed layer, wherein the aluminum layer has a thickness of 30 nm to 100 nm inclusive. 
 
     
     
       2. The method according to  claim 1 , wherein the metallic seed layer comprises Cu, Ti, Fe, Zn or Cr. 
     
     
       3. The method according to  claim 1 , wherein the metallic seed layer is between 2 nm and 5 nm thick. 
     
     
       4. The method according to  claim 1 , wherein the metallic seed layer is between 2.5 nm and 3.5 nm thick. 
     
     
       5. The method according to  claim 1 , wherein the aluminum layer has a root mean square surface roughness of less than 0.4 nm. 
     
     
       6. The method according to  claim 1 , further comprising applying a protective layer to the aluminum layer, wherein the protective layer has a thickness of not more than 5 nm. 
     
     
       7. An optical element comprising:
 a substrate; 
 a metallic seed layer on the substrate, the metallic seed layer having a thickness of not more than 5 nm; and 
 an aluminum layer disposed on a side of the metallic seed layer that faces away from the substrate, 
 wherein the aluminum layer directly adjoins the metallic seed layer, 
 wherein the aluminum layer has a thickness of 30 nm to 100 nm inclusive, and 
 wherein the aluminum layer has a root mean square roughness of less than 0.7 nm. 
 
     
     
       8. The optical element according to  claim 7 , wherein the metallic seed layer comprises Cu, Ti, Fe, Zn or Cr. 
     
     
       9. The optical element according to  claim 7 , wherein the optical element is a mirror, and wherein the aluminum layer is a mirror layer. 
     
     
       10. The optical element according to  claim 7 , wherein the metallic seed layer is between 2 nm and 5 nm thick. 
     
     
       11. The optical element according to  claim 7 , wherein the metallic seed layer is between 2.5 nm and 3.5 nm thick. 
     
     
       12. The optical element according to  claim 7 , wherein the aluminum layer has a root mean square surface roughness of less than 0.4 nm. 
     
     
       13. The optical element according to  claim 7 , further comprising a protective layer disposed on the aluminum layer, wherein the protective layer has a thickness of not more than 5 nm. 
     
     
       14. An optical element comprising:
 a substrate; 
 a metallic seed layer on the substrate, the metallic seed layer having a thickness of not more than 5 nm; and 
 an aluminum layer disposed on a side of the metallic seed layer that faces away from the substrate, 
 wherein the aluminum layer directly adjoins the metallic seed layer, 
 wherein the aluminum layer has a thickness of more than 30 nm, 
 wherein the metallic seed layer is between 2.5 nm and 3.5 nm thick, and 
 wherein all layers of the optical element are arranged on a same side of the substrate. 
 
     
     
       15. The optical element of  claim 14 , wherein the metallic seed layer comprises Cu, Ti, Fe, Zn or Cr. 
     
     
       16. The optical element of  claim 14 , wherein the optical element is a mirror, and wherein the aluminum layer is a mirror layer. 
     
     
       17. The optical element of  claim 14 , further comprising a protective layer disposed on the aluminum layer, wherein the protective layer has a thickness of not more than 5 nm. 
     
     
       18. The optical element of  claim 14 , wherein the aluminum layer has a root mean square surface roughness of less than 0.4 nm.

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