Storage device and operating method thereof

Abstract

A storage device may include: a memory device including a temperature sensor; and a memory controller for acquiring, from the memory device, temperature information sensed by the temperature sensor for a temperature management period, performing a performance limiting operation of limiting the performance of the memory device according to the temperature information, calculating the temperature management period by using the temperature information, and updating the temperature management period by using history information on a performance history of the performance limiting operation.

What is claimed is: 
     
       1. A storage device comprising:
 a memory device including a temperature sensor; and 
 a memory controller configured to: 
 perform a temperature acquisition operation to acquire temperature information sensed by the temperature sensor during a temperature management period, 
 calculate a minimum period and a maximum period based on the temperature information and a reference temperature management period, and 
 update the temperature management period, using at least one selected from among the minimum period and the maximum period according to history information on a count of a performance limiting operation to limit an operating performance of the memory device, and 
 perform the temperature acquisition operation according to the updated temperature management period. 
 
     
     
       2. The storage device of  claim 1 , wherein the memory controller includes:
 a period calculator configured to calculate the minimum period and the maximum period by using a temperature variation per a unit of time within each temperature management period and the reference temperature management period; 
 a period determiner configured to: 
 determine, as a current temperature reflected period, one of the minimum period, the maximum period, and an arithmetic mean value of the minimum period and the maximum period according to the temperature information, and 
 determine a history reflected period according to the count of the performance limiting operation after power is applied to the storage device; and 
 a period updater configured to update the temperature management period by using the current temperature reflected period, the history reflected period, the minimum period and the maximum period. 
 
     
     
       3. The storage device of  claim 2 , wherein the period calculator increases the minimum period and the maximum period when the temperature variation increases. 
     
     
       4. The storage device of  claim 2 , wherein the period calculator decreases the minimum period and the maximum period when the temperature variation decreases. 
     
     
       5. The storage device of  claim 2 ,
 wherein the period determiner determines the current temperature reflected period according to whether a temperature of the memory device corresponding to the temperature information belongs to one of a first range, a second range, and a third range, 
 wherein the first range is a temperature range higher than a first temperature and lower than or equal to a second temperature, 
 wherein the second range is one or more of a temperature range higher than 0° C. and lower than or equal to the first temperature and a temperature range higher than the second temperature and lower than or equal to a third temperature, and 
 wherein the third range is one or more of a temperature range lower than or equal to 0° C. and a temperature range higher than the third temperature. 
 
     
     
       6. The storage device of  claim 5 , wherein, when the temperature of the memory device corresponding to the temperature information belongs to the first range, the period determiner determines the maximum period as the current temperature reflected period. 
     
     
       7. The storage device of  claim 5 , wherein, when the temperature of the memory device corresponding to the temperature information belongs to the second range, the period determiner determines the arithmetic mean value of the minimum period and the maximum period as the current temperature reflected period. 
     
     
       8. The storage device of  claim 5 , wherein, when the temperature of the memory device corresponding to the temperature information belongs to the third range, the period determiner determines the minimum period as the current temperature reflected period. 
     
     
       9. The storage device of  claim 2 , wherein the memory controller further includes:
 a temperature information storage configured to store the temperature information; and 
 a history information storage configured to store the count of the performance limiting operation after the power is applied to the storage device. 
 
     
     
       10. The storage device of  claim 2 , wherein the period updater updates the temperature management period by using an arithmetic mean value of the current temperature reflected period and the history reflected period. 
     
     
       11. The storage device of  claim 1 , wherein, when a temperature of the memory device corresponding to the temperature information is higher than a third temperature, the memory controller performs the performance limiting operation of limiting the operating performance of the memory device. 
     
     
       12. A method for operating a storage device including a temperature sensor, the method comprising:
 performing a temperature acquisition operation to acquire temperature information sensed by the temperature sensor during a temperature management period; 
 calculating a minimum period and a maximum period based on the temperature information and a reference temperature management period; 
 updating the temperature management period using at least one selected from among the minimum period and the maximum period according to history information on a count of a performance limiting operation; and 
 performing the temperature acquisition operation according to the updated temperature management period. 
 
     
     
       13. The method of  claim 12 , further comprising:
 determining, as a current temperature reflected period, one of the minimum period, the maximum period, and the arithmetic mean value of the minimum period and the maximum period according to the temperature information; and 
 determining a history reflected period according to the count of the performance limiting operation after power is applied to the storage device. 
 
     
     
       14. The method of  claim 13 , wherein the temperature management period is updated by using the current temperature reflected period and the history reflected period. 
     
     
       15. The method of  claim 12 , wherein the calculating includes:
 increasing the minimum period and the maximum period when a temperature variation per a unit of time corresponding to the temperature information increases, and 
 decreasing the minimum period and the maximum period when the temperature variation decreases. 
 
     
     
       16. The method of  claim 13 ,
 wherein the current temperature reflected period is determined according to whether a temperature of the memory device corresponding to the temperature information belongs to one of a first range, a second range, and a third range, 
 wherein the first range is a temperature range higher than a first temperature and lower than or equal to a second temperature, 
 wherein the second range is one or more of a temperature range higher than 0° C. and lower than or equal to the first temperature and a temperature range higher than the second temperature and lower than or equal to a third temperature, and 
 wherein the third range is one or more of a temperature range lower than or equal to 0° C. and a temperature range higher than the third temperature. 
 
     
     
       17. The method of  claim 16 ,
 wherein the maximum period is determined as the current temperature reflected period when the temperature of the memory device corresponding to the temperature information belongs to the first range, 
 wherein the arithmetic mean value of the minimum period and the maximum period is determined as the current temperature reflected period when the temperature of the memory device corresponding to the temperature information belongs to the second range, and 
 wherein the minimum period is determined as the current temperature reflected period when the temperature of the memory device corresponding to the temperature information belongs to the third range. 
 
     
     
       18. The method of  claim 12 , further comprising storing the temperature information and the count of the performance limiting operation after power is applied to the storage device.