US11761824B2ActiveUtilityA1
Temperature sensing system
Assignee: SHANGHAI ZHAOXIN SEMICONDUCTOR CO LTDPriority: Sep 30, 2020Filed: Oct 30, 2020Granted: Sep 19, 2023
Est. expirySep 30, 2040(~14.2 yrs left)· nominal 20-yr term from priority
G01K 7/00G01K 7/01G01K 3/14G01K 7/22H03M 1/12G01K 1/026
56
PatentIndex Score
0
Cited by
19
References
10
Claims
Abstract
A temperature sensing system with simplified wiring comprises an in-core temperature sensing component and an out-of-core temperature-evaluation device. The out-of-core temperature-evaluation device provides a plurality of currents to the in-core temperature sensing module in a time-sharing manner. Corresponding to the plurality of currents, the in-core temperature sensing component generates a plurality of potentials to the out-of-core temperature-evaluation device. The out-of-core temperature-evaluation device evaluates a temperature data by performing a difference calculation on the plurality of potentials.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1. A temperature sensing system, comprising:
an in-core temperature sensing component, including a diode that receives a plurality of currents alternately, and generating a plurality of potentials according to the plurality of currents alternately directed into the same diode, wherein the in-core temperature sensing component outputs the plurality of currents to an in-core ground;
an out-of-core temperature evaluation device, coupled to the in-core temperature sensing component to provide the plurality of currents to the in-core temperature sensing component, receiving the plurality of potentials to calculate a potential difference, and evaluating a temperature data according to the potential difference, wherein the out-of-core temperature-evaluation device is grounded to an out-of-core ground; and
a circuit trace, transferring the plurality of currents from the out-of-core temperature-evaluation device to the in-core temperature sensing component;
wherein:
the out-of-core temperature-evaluation device comprises an analog-to-digital converter; and
the analog-to-digital converter is coupled to the circuit trace to receive the plurality of potentials generated by the in-core temperature sensing component and returned through the circuit trace, and convert the received plurality of potentials from analogue to digital for potential difference evaluation.
2. The temperature sensing system as claimed in claim 1 , wherein:
the out-of-core temperature-evaluation device provides a first current and a second current to the in-core temperature sensing component alternately;
the second current is N times of the first current, wherein N is a value greater than 1;
corresponding to the first current, the analog-to-digital converter generates a first digital potential;
corresponding to the second current, the analog-to-digital converter generates a second digital potential;
the out-of-core temperature-evaluation device subtracts the second digital potential from the first digital potential to generate the potential difference; and
the out-of-core temperature-evaluation device evaluates the temperature data according to the potential difference and the value N,
wherein the plurality of currents comprises the first current and the second current.
3. The temperature sensing system as claimed in claim 2 , wherein:
the out-of-core temperature-evaluation device comprises a plurality of identical current sources, and generates the first current and the second current through a dynamic element-matching operation.
4. The temperature sensing system as claimed in claim 1 , wherein:
the out-of-core temperature-evaluation device provides a first current, a second current and a third current to the in-core temperature sensing component alternately;
the third current is N times of the second current, and the second current is N times of the first current, wherein N is a value greater than 1;
corresponding to the first current, the analog-to-digital converter generates a first digital potential;
corresponding to the second current, the analog-to-digital converter generates a second digital potential;
corresponding to the third current, the analog-to-digital converter generates a third digital potential;
the out-of-core temperature-evaluation device subtracts a second difference between the third digital potential and the second digital potential from a first difference between the second digital potential and the first digital potential to generate the potential difference; and
the out-of-core temperature-evaluation device evaluates the temperature data according to the potential difference and the value N,
wherein the plurality of currents comprises the first current, the second current and the third current.
5. The temperature sensing system as claimed in claim 4 , wherein the out-of-core temperature-evaluation device evaluates that the temperature data is:
[
N
·
(
V
2
-
V
1
)
-
(
V
3
-
V
2
)
N
-
1
]
·
q
(
Nf
)
·
K
·
Ln
(
N
)
wherein V 1 , V 2 , and V 3 are the first digital potential, the second digital potential and the third digital potential respectively, q is the charge of an electron, Nf is an ideal factor close to 1, and K is the Boltzman's constant.
6. The temperature sensing system as claimed in claim 4 , wherein:
the out-of-core temperature-evaluation device includes a plurality of identical current sources, and generates the first current, the second current and the third current through a dynamic element-matching operation.
7. A temperature sensing system, comprising:
an in-core temperature sensing component, including a diode that receives a plurality of currents alternately, and generating a plurality of potentials according to the plurality of currents alternately directed into the same diode, wherein the in-core temperature sensing component outputs the plurality of currents to an in-core ground;
an out-of-core temperature evaluation device, coupled to the in-core temperature sensing component to provide the plurality of currents to the in-core temperature sensing component, receiving the plurality of potentials to calculate a potential difference, and evaluating a temperature data according to the potential difference, wherein the out-of-core temperature-evaluation device is grounded to an out-of-core ground; and
a first circuit trace transferring the plurality of currents to the in-core temperature sensing component, a second circuit trace, coupled to a first terminal of the diode, and a third circuit trace coupled to a second terminal of the diode, wherein, corresponding to the plurality of currents, the second circuit trace and the third circuit trace provide the plurality of potentials to the out-of-core temperature-evaluation device;
wherein:
the out-of-core temperature-evaluation device comprises an analog-to-digital converter; and
the analog-to-digital converter is coupled to the second circuit trace and the third circuit trace to receive the plurality of potentials generated by the in-core temperature sensing component and returned through the second circuit trace and the third circuit trace, and convert the received plurality of potentials from analogue to digital for potential difference evaluation.
8. The temperature sensing system as claimed in claim 7 , wherein:
the out-of-core temperature-evaluation device provides a first current and a second current to the in-core temperature sensing component alternately;
the second current is N times of the first current, wherein N is a value greater than 1;
corresponding to the first current, the analog-to-digital converter generates a first digital potential and a second digital potential;
corresponding to the second current, the analog-to-digital converter generates a third digital potential and a fourth digital potential;
the out-of-core temperature-evaluation device subtracts a first difference between the first digital potential and the second digital potential from a second difference between the third digital potential and the fourth digital potential to generate the potential difference; and
the out-of-core temperature-evaluation device evaluates the temperature data according to the potential difference and the value N,
wherein the plurality of currents comprises the first current and the second current.
9. The temperature sensing system as claimed in claim 8 , wherein the out-of-core temperature-evaluation device evaluates that the temperature data is:
[
(
VP
2
-
VN
2
)
-
(
VP
1
-
VN
1
)
]
·
q
(
Nf
)
·
K
·
Ln
(
N
)
wherein VP 1 and VP 2 are the first digital potential and the third digital potential respectively, VN 1 and VN 2 are the second digital potential and the fourth digital potential respectively, q is the charge of an electron, Nf is an ideal factor close to 1, and K is the Boltzman's constant.
10. The temperature sensing system as claimed in claim 8 , wherein:
the out-of-core temperature-evaluation device includes a plurality of identical current sources, and generates the first current and the second current through a dynamic element-matching operation.Cited by (0)
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