Microdevice cartridge mapping and compensation

Abstract

This disclosure is related to compensation of micro devices based on cartridge information.

The invention claimed is: 
     
       1. A method of populating a system (receiver) substrate with micro devices, the method comprising:
 binning the micro devices in adjacent areas of a cartridge; 
 extracting at least one parameter for at least one of the micro devices in the cartridge; and 
 selecting and arranging the cartridges to populate the system substrate so that the parameter extracted for adjacent cartridges is within a predefined threshold. 
 
     
     
       2. A method of populating a system (receiver) substrate micro devices, the method comprising:
 binning microdevices in adjacent areas of a cartridge; 
 extracting at least a distribution map for one parameter for the micro devices in the cartridge; and 
 selecting and arranging the cartridges to populate the system substrate so that the distribution map for at least one of the parameters forms a continuous map with a step within a defined threshold between the map of the cartridges associated with the corresponding adjacent areas on the system substrate. 
 
     
     
       3. A method of populating a system (receiver) substrate with micro devices, the method comprising:
 arranging the micro devices in a cartridge; 
 extracting at least one parameter for at least one of the micro devices in the cartridge; and 
 selecting and arranging the cartridges to populate the system substrate so that the parameter extracted for adjacent cartridges is within a predefined threshold. 
 
     
     
       4. A method of populating a system (receiver) substrate micro devices, the method comprising:
 arranging microdevices in a cartridge; 
 extracting at least a distribution map for one parameter for the micro devices in the cartridge; and 
 selecting and arranging the cartridges to populate the system substrate so that the distribution map for at least one of the parameters forms a continuous map with a step within a defined threshold between the map of the cartridges associated with the corresponding adjacent areas on the system substrate.