Test device and test method for DFB-LD for RoF system

Abstract

A test device and method for testing a distributed feedback laser diode (DFB-LD) device for an optical transceiver of a radio over fiber (RoF) system examines the DFB-LD device based on an absolute limiting rating, an operating case environment, and a functional specification, in which the absolute limiting rating is a rating at which there is no fatal damage to the DFB-LD device during a short period of time when each limiting parameter is isolated and all other parameters are in a normal performance parameter, the operating case environment includes an operating temperature, and the functional specification includes parameters to be tested according to an operating condition for the functional specification.

What is claimed is: 
     
       1. A test device for testing a distributed feedback laser diode (DFB-LD) device for a radio over fiber (RoF) system, comprising:
 a computer for applying maximum and minimum limiting ratings for a plurality of parameters to the DFB-LD device during testing, wherein the parameters are applied one at a time while all other parameters are kept in a normal performance range for a preset period of time and no fatal damage to the DFD-LD occurs during the preset period of time; 
 a case for subjecting the DFB-LD to a desired temperature during testing; 
 the computer for applying various functional specification parameters according to an operating condition for a function specification to the DFB-LD device during testing; and 
 a measuring device for measuring the DFB-LD device during testing. 
 
     
     
       2. The test device of  claim 1 , wherein the operating condition for the functional specification comprises a case temperature. 
     
     
       3. The test device of  claim 1 , wherein the parameters for the functional specification comprise:
 (i) a threshold current, (ii) an optical output power at the threshold current, (iii) an operating current, (iv) an operating voltage, (v) a slope efficiency, (vi) a delta slope efficiency, (vii) a light-emission current wavelength, (viii) a wavelength temperature coefficient, (ix) a side mode suppression ratio, (x) a tracking error, (xi) a monitor current, (xii) a dark current, (xiii) a relative intensity noise, and (xiv) a third-order intermodulation distortion. 
 
     
     
       4. The test device of  claim 1 , wherein a test plan for the DFB-LD device comprises:
 (i) a package, (ii) first temperature storage, (iii) second temperature storage, (iv) temperature cycling, (v) damp heat, (vi) temperature-humidity cycling, (vii) fiber pull, (viii) laser diode sub-mount, (ix) a photodiode in a representative package, (x) a mechanical impact, (ix) a vibration, (xii) a drastic temperature change, (xiii) an electrostatic discharge (ESD), and (xiv) an internal humidity, under which a test on the DFB-LD device is performed. 
 
     
     
       5. The test device of  claim 1 , wherein a laser diode of the DFB-LD device is tested according to an operating current, a slope efficiency, a forward voltage, and a kink on a light-current (L/I) curve. 
     
     
       6. The test device of  claim 1 , wherein a photodiode of the DFB-LD device is tested according to a dark current. 
     
     
       7. The test device of  claim 1 , wherein a laser package of the DFB-LD device is tested according to (i) an operating current, (ii) an output power of a fiber or connector, (iii) a kink on an L/I curve, and (iv) a photodiode dark current. 
     
     
       8. A test method of testing a distributed feedback laser diode (DFB-LD) device for a radio over fiber (RoF) system, the test method comprising:
 identifying the DFB-LD device; 
 applying maximum and minimum limiting ratings for a plurality of parameters to the DFB-LD device during testing, wherein the parameters are applied one at a time while all other parameters are kept in a normal performance range for a preset period of time and no fatal damage to the DFD-LD occurs during the preset period of time; 
 subjecting the DFB-LD to a desired temperature during testing; 
 applying various functional specification parameters according to an operating condition for a function specification to the DFB-LD device during testing; and 
 measuring the DFB-LD device during testing. 
 
     
     
       9. The test method of  claim 8 , wherein the operating condition for the functional specification comprises a case temperature. 
     
     
       10. The test method of  claim 8 , wherein parameters for the functional specification comprise:
 (i) a threshold current, (ii) an optical output power at the threshold current, (iii) an operating current, (iv) an operating voltage, (v) a slope efficiency, (vi) a delta slope efficiency, (vii) a light-emission current wavelength, (viii) a wavelength temperature coefficient, (ix) a side mode suppression ratio, (x) a tracking error, (xi) a monitor current, (xii) a dark current, (xiii) a relative intensity noise, and (xiv) a third-order intermodulation distortion. 
 
     
     
       11. The test method of  claim 8 , wherein a test plan for the DFB-LD device comprises:
 (i) a package, (ii) first temperature storage, (iii) second temperature storage, (iv) temperature cycling, (v) damp heat, (vi) temperature-humidity cycling, (vii) fiber full, (viii) a laser diode sub-mount, (ix) a photodiode in a representative package, (x) a mechanical impact, (xi) a vibration, (xii) a drastic temperature change, (xiii) an electrostatic discharge (ESD), and (xiv) an internal humidity, under which the test is performed. 
 
     
     
       12. The test method of  claim 8 , wherein a laser diode of the DFB-LD device is tested according to an operating current, a slope efficiency, a forward voltage, and a kink on a light-current (L/I) curve. 
     
     
       13. The test method of  claim 8 , wherein a photodiode of the DFB-LD device is tested according to a dark current. 
     
     
       14. The test method of  claim 8 , wherein a laser package of the DFB-LD device is tested according to (i) an operating current, (ii) an output power of a fiber or connector, (iii) a kink on an L/I curve, and (iv) a photodiode dark current.