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US12408495B2ActiveUtilityPatentIndex 55

Semiconductor light-emitting element

Assignee: NIKKISO CO LTDPriority: Jul 30, 2021Filed: Jul 28, 2022Granted: Sep 2, 2025
Est. expiryJul 30, 2041(~15.1 yrs left)· nominal 20-yr term from priority
Inventors:KOJIMA NATSUKIINAZU TETSUHIKONIWA NORITAKA
H10H 20/8252H10H 20/0137H10H 20/825H10H 20/835
55
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References
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Claims

Abstract

A semiconductor light-emitting element includes: an n-type semiconductor layer made of an n-type AlGaN-based semiconductor material; an active layer provided on the n-type semiconductor layer and made of an AlGaN-based semiconductor material; a p-type semiconductor layer provided on the active layer; a p-side contact electrode that includes a Rh layer in contact with an upper surface of the p-type semiconductor layer; and a p-side current diffusion layer that is in contact with an upper surface and a side surface of the p-side contact electrode and includes a TiN layer, a Ti layer, a Rh layer, and a TiN layer stacked successively. An Ar concentration in the Rh layer included in the p-side contact electrode is smaller than an Ar concentration in the Rh layer included in the p-side current diffusion layer.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
       1. A semiconductor light-emitting element comprising:
 an n-type semiconductor layer made of an n-type AlGaN-based semiconductor material; 
 an active layer provided on the n-type semiconductor layer and made of an AlGaN-based semiconductor material; 
 a p-type semiconductor layer provided on the active layer; 
 a p-side contact electrode that includes a Rh layer in contact with an upper surface of the p-type semiconductor layer; and 
 a p-side current diffusion layer that is in contact with an upper surface and a side surface of the p-side contact electrode and includes a TiN layer, a Ti layer, a Rh layer, and a TiN layer stacked successively, wherein 
 an Ar concentration in the Rh layer included in the p-side contact electrode is smaller than an Ar concentration in the Rh layer included in the p-side current diffusion layer. 
 
     
     
       2. The semiconductor light-emitting element according to  claim 1 , wherein
 the Ar concentration in the Rh layer included in the p-side contact electrode is less than 1×10 18 /cm 3 , and 
 the Ar concentration in the Rh layer included in the p-side current diffusion layer is equal to or more than 1×10 18 /cm 3 .

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