US12558044B2ActiveUtilityA1

Photon counting CT apparatus and method of controlling photon counting CT apparatus

72
Assignee: CANON MEDICAL SYSTEMS CORPPriority: Mar 2, 2023Filed: Mar 1, 2024Granted: Feb 24, 2026
Est. expiryMar 2, 2043(~16.7 yrs left)· nominal 20-yr term from priority
Inventors:NISHIJIMA AKIRA
A61B 6/035A61B 6/4233A61B 6/4488A61B 6/4241A61B 6/032
72
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Claims

Abstract

A photon counting CT apparatus of an embodiment has a detector module including a semiconductor detector and first processing circuitry configured to process detection data detected by the semiconductor detector. The first processing circuitry is configured to generate heat by performing a pseudo operation during a period in which X-ray exposure is stopped.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
         1 . A photon counting CT apparatus comprising: a detector module including a semiconductor detector; and first processing circuitry configured to process detection data detected by the semiconductor detector,
 wherein the first processing circuitry is configured to generate heat by performing a pseudo operation during a period in which an X-ray exposure is stopped.   
     
     
         2 . The photon counting CT apparatus according to  claim 1 , wherein the first processing circuitry is configured to perform the pseudo operation to maintain a preset reference temperature. 
     
     
         3 . The photon counting CT apparatus according to  claim 2 , wherein the reference temperature is an estimated temperature of the first processing circuitry at a time of the X-ray exposure. 
     
     
         4 . The photon counting CT apparatus according to  claim 1 , further comprising second processing circuitry configured to:
 acquire imaging conditions for a subject;   calculate an amount of heat generated by the first processing circuitry under the acquired imaging conditions;   determine an operation amount of the pseudo operation in accordance with the calculated amount of heat; and   input a pseudo operation control signal based on the determined operation amount to the first processing circuitry.   
     
     
         5 . The photon counting CT apparatus according to  claim 1 , further comprising second processing circuitry configured to:
 acquire a temperature of the detector module;   calculate an amount of heat generated by the first processing circuitry on the basis of a difference between the acquired temperature and an estimated temperature of the detector module at the time of the X-ray exposure;   determine an operation amount of the pseudo operation in accordance with the calculated amount of heat; and   input a pseudo operation control signal based on the determined operation amount to the first processing circuitry.   
     
     
         6 . The photon counting CT apparatus according to  claim 5 , wherein a series of operations performed by the second processing circuitry is repeated until a start of the X-ray exposure. 
     
     
         7 . The photon counting CT apparatus according to  claim 1 ,
 wherein the semiconductor detector includes a plurality of detection units arranged in a channel direction, and   wherein an operation amount of the first processing circuitry corresponding to the detection unit located in a central region in the channel direction is controlled to be greater than an operation amount of the first processing circuitry corresponding to the detection unit located in an edge region, among the plurality of detection units.   
     
     
         8 . The photon counting CT apparatus according to  claim 1 , further comprising a cooling device configured to cool the detector module. 
     
     
         9 . A photon counting CT apparatus comprising a semiconductor detector and a heating element disposed near the semiconductor detector,
 wherein the heating element is configured to generate heat by performing a pseudo operation during a period in which an X-ray exposure is stopped.   
     
     
         10 . A method of controlling a photon counting CT apparatus comprising a detector module including a semiconductor detector and first processing circuitry configured to process detection data detected by the semiconductor detector, the method comprising causing the first processing circuitry to generate heat by causing the first processing circuitry to perform a pseudo operation during a period in which an X-ray exposure is stopped.

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