US2001046051A1PendingUtilityA1

Turbidimeter array system

Priority: Nov 19, 1999Filed: Jul 6, 2001Published: Nov 29, 2001
Est. expiryNov 19, 2019(expired)· nominal 20-yr term from priority
Inventors:Ashim Banerjee
G01N 21/253G01N 2201/0636
43
PatentIndex Score
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Claims

Abstract

A turbidimeter array system for measuring the turbidity of each of a plurality of liquid samples. The system includes a plurality of sample chambers, a single light source and a single detector. The light source directs a light beam into the liquid sample and the detector detects light scattered by the liquid sample.

Claims

exact text as granted — not AI-modified
What is claimed is:  
     
         1 . A turbidimeter array system for measuring the turbidity of each of a plurality of liquid samples, the system comprising a plurality of sample chambers each including a liquid sample to be tested, wherein said system includes a single light source and a single detector means, wherein said light source directs a light beam into said liquid sample and said detector means detects light scattered by said liquid sample.  
     
     
         2 . A turbidimeter array system for measuring the turbidity of each of a plurality of liquid samples, the system comprising: 
 (a) a plurality of sample chambers each including a liquid sample to be tested;    (b) a single light source means for sequentially directing a light beam into each of said sample chambers; and    (c) detector means for sequentially detecting light scattered by said liquid sample in each of said sample chambers.    
     
     
         3 . A system in accordance with    claim 2   , wherein each said sample chamber includes a light inlet window and a light outlet window.  
     
     
         4 . A system in accordance with    claim 2   , wherein said sample chambers are aligned in a side-by-side manner.  
     
     
         5 . A system in accordance with    claim 3   , further comprising first optical fiber means positioned between said light source and said light inlet window for transmitting light to said sample chamber, and further comprising second optical fiber means positioned between said light outlet window for transmitting scattered light from said outlet window to said detector means.  
     
     
         6 . A system in accordance with    claim 5   , wherein said first optical fiber means includes a first end positioned at said light inlet window and a second end positioned in a rotatable disk adjacent said light source, wherein rotation of said disk enables said light source to transmit light through a desired one of said first optical fiber means.  
     
     
         7 . A system in accordance with    claim 5   , wherein said second optical fiber means includes a first end positioned at said light outlet window and a second end positioned in a rotatable disk adjacent said detector means, wherein rotation of said disk enables said detector means to detect light transmitted by a desired one of said second optical fiber means.  
     
     
         8 . A system in accordance with    claim 2   , wherein said detector means comprises a photomultiplier tube, a photodiode or an avalanche photodiode.  
     
     
         9 . A system in accordance with    claim 2   , further comprising calibration verification means operatively associated with each said chamber, wherein said calibration verification means comprises: 
 (a) a beam splitter for splitting the light from said light source into first and second beams;    (b) polarizer means for polarizing the light in said second beam and controlling the amount of light passing through said polarizer means, and    (c) shutter means for controlling transmittance of said second beam into said chamber.    
     
     
         10 . A turbidimeter array system comprising: 
 (d) a plurality of sample chambers each including a liquid sample to be tested;    (e) light source means operatively associated with each said sample chamber;    (f) a single detector means adapted to sequentially detect light scattered by said liquid sample in each of said sample chambers.

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