Pattern testing board

Abstract

A pattern testing system is able to detect an emission beam such as a laser or light beam from a shooting system. A single pattern testing board includes a plurality of paired emission beam sensors and hit indicators. Each emission beam sensor is responsive to a detected emission beam and each hit indicator signals the sensing of the emission beam by the associated emission beam sensor. Multiple pattern testing boards may be mounted together to provide a larger pattern testing system array. Further, an overlay with a representation thereon, a moving image display system, or a reflective moving image display system may be positioned in front of one or more pattern testing boards.

1 . A pattern testing board for detecting an emission beam's presence and pattern, said pattern testing board comprising: 
 (a) a plurality of emission beam sensors responsive to said emission beam; and    (b) a plurality of hit indicators each associated with and responsive to at least one emission beam sensor; and    (c) wherein said hit indicators signal the sensing of said emission beam by said associated emission beam sensor.    
     
     
         2 . The pattern testing board of  claim 1  wherein each hit indicator is associated with and responsive to a respective emission beam sensor, each said hit indicator signaling the sensing of said emission beam by its respective emission beam sensor.  
     
     
         3 . The pattern testing board of  claim 1  wherein said hit indicators are arranged substantially symmetrically around a central point.  
     
     
         4 . The pattern testing board of  claim 1  wherein said emission beam sensors are arranged substantially symmetrically around a central point.  
     
     
         5 . The pattern testing board of  claim 1  wherein said hit indicators are illuminated when their associated emission beam sensor senses the presence of said emission beam.  
     
     
         6 . The pattern testing board of  claim 1  wherein said hit indicators are illuminated when their associated emission beam sensor senses the presence of said emission beam and for an additional predefined period of time thereafter.  
     
     
         7 . The pattern testing board of  claim 1  wherein said hit indicators are arranged in an array.  
     
     
         8 . The pattern testing board of  claim 1  wherein said emission beam sensors are arranged in an array.  
     
     
         9 . The pattern testing board of  claim 1  wherein an overlay is positioned in front of said pattern testing board.  
     
     
         10 . The pattern testing board of  claim 1  wherein a moving image display system is positioned in front of said pattern testing board.  
     
     
         11 . The pattern testing board of  claim 1  wherein a reflective moving image display system is positioned in front of said pattern testing board.  
     
     
         12 . The pattern testing board of  claim 1  wherein a plurality of said pattern testing boards are arrangable in an array.  
     
     
         13 . The pattern testing board of  claim 12  wherein an array of pattern testing boards are mountable to support structure.  
     
     
         14 . The pattern testing board of  claim 12  wherein an array of pattern testing boards are electrically interconnectable.  
     
     
         15 . The pattern testing board of  claim 12  wherein an overlay is positioned in front of an array of pattern testing boards.  
     
     
         16 . The pattern testing board of  claim 15  wherein said hit indicators are viewable through said overlay.  
     
     
         17 . The pattern testing board of  claim 15  wherein said overlay is suitable to allow said emission beam to pass through.  
     
     
         18 . The pattern testing board of  claim 15  wherein said overlay has a representation thereon.  
     
     
         19 . The pattern testing board of  claim 18  wherein said overlay has “kill zones” depicted within said representation.  
     
     
         20 . The pattern testing board of  claim 12  wherein a moving image display system is positioned in front of an array of pattern testing boards.  
     
     
         21 . The pattern testing board of  claim 20  wherein said hit indicators are viewable through said moving image display system.  
     
     
         22 . The pattern testing board of  claim 20  wherein said moving image display system is suitable to allow said emission beam to pass through.  
     
     
         23 . The pattern testing board of  claim 12  wherein a reflective moving image display system is positioned in front of an array of pattern testing boards.  
     
     
         24 . The pattern testing board of  claim 23  wherein said hit indicators are viewable through said reflective moving image display system.  
     
     
         25 . The pattern testing board of  claim 23  wherein said reflective moving image display system is suitable to allow said emission beam to pass through.  
     
     
         26 . A pattern testing system for detecting an emission beam's presence and pattern, said pattern testing system comprising: 
 (a) a plurality of paired emission beam sensors and hit indicators, each emission beam sensor responsive to said emission beam, each hit indicator is associated with and responsive to at least one emission beam sensor, and each said hit indicator signaling the sensing of said emission beam by said associated emission beam sensor;    (b) a plurality of pattern testing boards, each pattern testing board having an array of said paired emission beam sensors and hit indicators thereon;    (c) said plurality of pattern testing boards arrangable in an array and electrically interconnectable;    (d) an overlay positionable in front of said plurality of pattern testing boards, said hit indicators being viewable through said overlay, and said overlay being permeable to said emission beams.    
     
     
         27 . The pattern testing system of  claim 26  wherein an array of pattern testing boards are mountable to support structure.  
     
     
         28 . The pattern testing board of  claim 26  wherein said overlay has a representation thereon.  
     
     
         29 . The pattern testing board of  claim 28  wherein said overlay has “kill zones” depicted within said representation.